PH

Paul K. Hansma

University of California: 27 patents #97 of 18,278Top 1%
DI Digital Instruments: 4 patents #5 of 25Top 20%
BN Bruker Nano: 1 patents #76 of 148Top 55%
TC The Regents Of The University Of Calif.: 1 patents #5 of 63Top 8%
📍 Goleta, CA: #34 of 1,303 inventorsTop 3%
🗺 California: #16,431 of 386,348 inventorsTop 5%
Overall (All Time): #118,900 of 4,157,543Top 3%
31
Patents All Time

Issued Patents All Time

Showing 1–25 of 31 patents

Patent #TitleCo-InventorsDate
10488391 Neural circuit probe Kenneth S. Kosik, Luke S. K. Theogarajan, Barney Drake, Daniel Bridges, Connor Randall +1 more 2019-11-26
9983107 Self-aligning probes and related devices Connor Randall, Daniel Bridges 2018-05-29
9895104 Method and device for reference point indentation without a reference probe Randall Connor, Daniel Bridges 2018-02-20
8398568 Methods and instruments for assessing bone fracture risk Douglas J. Rehn, Georg Fantner, Patricia J. Turner 2013-03-19
8087288 Scanning stylus atomic force microscope with cantilever tracking and optical access Craig Prater, James Massie, David Grigg, Virgil B. Elings, Barney Drake 2012-01-03
7966866 Methods and instruments for materials testing Barney Drake, Douglas J. Rehn, Jonathan Adams, Jason Lulejian 2011-06-28
7878987 Methods and instruments for assessing bone fracture risk Douglas J. Rehn, Georg Fantner, Patricia J. Turner 2011-02-01
7555941 Scanner for probe microscopy Georg Fantner, Johannes Kindt 2009-07-07
7278298 Scanner for probe microscopy Georg Fantner, Johannes Kindt 2007-10-09
6871527 Measurement head for atomic force microscopy and other applications Barney Drake, James A. Thompson, Johannes Kindt, David K. Hale 2005-03-29
6783709 Self-healing organosiloxane materials containing reversible and energy-dispersive crosslinking domains John H. Harreld, Michael S. Wong, Daniel E. Morse, Galen D. Stucky 2004-08-31
6649902 Summing the output of an array of optical detector segments in an atomic force microscope Tilman Schäffer 2003-11-18
6455838 High sensitivity deflection sensing device Tilman Schäffer 2002-09-24
6376636 Modular, energy-dissipating material and method for using it Johannes Kindt, Timothy J. Deming, Daniel E. Morse, Galen D. Stucky 2002-04-23
6032518 Scanning stylus atomic force microscope with cantilever tracking and optical access Craig Prater, James Massie, David Grigg, Virgil B. Elings, Barney Drake 2000-03-07
6016693 Microfabrication of cantilevers using sacrificial templates Mario B. Viani, Ami Chand, Mark A. Wendman, Hal J. Morrett 2000-01-25
5925818 Method and apparatus for magnetic force control of a scanning probe Jason Cleveland, William Ducker 1999-07-20
5825020 Atomic force microscope for generating a small incident beam spot Tilman Schäffer, Jason Cleveland 1998-10-20
5714682 Scanning stylus atomic force microscope with cantilever tracking and optical access Craig Prater, James Massie, David Grigg, Virgil B. Elings, Barney Drake 1998-02-03
5670712 Method and apparatus for magnetic force control of a scanning probe Jason Cleveland, William Ducker 1997-09-23
5581082 Combined scanning probe and scanning energy microscope Deron Walters, Paul E. Hillner 1996-12-03
5560244 Scanning stylus atomic force microscope with cantilever tracking and optical access Craig Prater, James Massie, David Grigg, Virgil B. Elings, Barney Drake 1996-10-01
5479024 Method and apparatus for performing near-field optical microscopy Paul E. Hillner, Manfred Radmacher 1995-12-26
5463897 Scanning stylus atomic force microscope with cantilever tracking and optical access Craig Prater, James Massie, David Grigg, Virgil B. Elings, Barney Drake 1995-11-07
RE34708 Scanning ion conductance microscope Barney Drake 1994-08-30