Issued Patents All Time
Showing 1–25 of 53 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12241896 | Proteomic assay using quantum sensors | Karoly Holczer, Barry Patrick John Vant-Hull | 2025-03-04 |
| 12134798 | Methods of detecting a leak from a subarray of a microarray chip, kits of components that facilitate leak detection, and microarray chips configured for leak detection | Rachel Woolaver Trahan, Jon H. Monserud, Maarten Rutgers, Barry Patrick John Vant-Hull, Stephan Kraemer | 2024-11-05 |
| 12064769 | Method for conducting uniform reactions | Jon H. Monserud, Barry Patrick John Vant-Hull, Alex Kislukhin | 2024-08-20 |
| RE49997 | Metrological scanning probe microscope | Aleksander Labuda, Deron Walters, Roger Proksch | 2024-06-04 |
| 11698373 | Proteomic assay using quantum sensors | Karoly Holczer, Barry Patrick John Vant-Hull | 2023-07-11 |
| 11249080 | Proteomic assay using quantum sensors | Karoly Holczer, Barry Patrick John Vant-Hull | 2022-02-15 |
| 10705114 | Metrological scanning probe microscope | Aleksander Labuda, Deron Walters, Roger Proksch | 2020-07-07 |
| 10481155 | Proteomic assay using quantum sensors | Karoly Holczer, Barry Patrick John Vant-Hull | 2019-11-19 |
| 10416190 | Modular atomic force microscope with environmental controls | Mario Viani, Roger Proksch, Maarten Rutgers, Jim Hodgson | 2019-09-17 |
| 10337890 | Integrated micro actuator and LVDT for high precision position measurements | Roger Proksch, Dan Bocek, Matthew Longmire, Matthew Klonowski | 2019-07-02 |
| 10338096 | Metrological scanning probe microscope | Aleksander Labuda, Deron Walters, Roger Proksch | 2019-07-02 |
| 10107832 | Fully digitally controller for cantilever-based instruments | Roger Proksch, Dan Bocek, Todd Day, Mario Viani, Clint Callahan | 2018-10-23 |
| 10054612 | Optical beam positioning unit for atomic force microscope | Aleksander Labuda, Deron Walters, Roger Proksch | 2018-08-21 |
| 9921242 | Automated atomic force microscope and the operation thereof | Roger Proksch, Roger C. Callahan, Frank Stetter, Ted Limpoco, Sophia Hohlbauch +2 more | 2018-03-20 |
| 9804193 | Metrological scanning probe microscope | Aleksander Labuda, Deron Walters, Roger Proksch | 2017-10-31 |
| 9689890 | Fully digitally controller for cantilever-based instruments | Roger Proksch, Dan Bocek, Todd Day, Mario Viani, Clint Callahan | 2017-06-27 |
| 9581616 | Modular atomic force microscope with environmental controls | Mario Viani, Roger Proksch, Maarten Rutgers, Jim Hodgson | 2017-02-28 |
| 9518814 | Integrated micro actuator and LVDT for high precision position measurements | Roger Proksch, Dan Bocek, Matthew Longmire, Matthew Klonowski | 2016-12-13 |
| 9383388 | Automated atomic force microscope and the operation thereof | Roger Proksch, Roger C. Callahan, Frank Stetter, Ted Limpoco, Sophia Hohlbach +1 more | 2016-07-05 |
| 9383386 | Optical beam positioning unit for atomic force microscope | Aleksander Labuda, Deron Walters, Roger Proksch | 2016-07-05 |
| 9097737 | Modular atomic force microscope with environmental controls | Mario Viani, Roger Proksch, Maarten Rutgers, Jim Hodgson | 2015-08-04 |
| 9063042 | Nanoindenter | Flavio Alejandro Bonilla, Roger Proksch, Tim Sauter | 2015-06-23 |
| 8925376 | Fully digitally controller for cantilever-based instruments | Roger Proksch, Dan Bocek, Todd Day, Mario Viani, Clint Callahan | 2015-01-06 |
| 8502525 | Integrated micro actuator and IVDT for high precision position measurements | Roger Proksch, Dan Bocek, Matthew Longmire, Matthew Klonowski | 2013-08-06 |
| 8459102 | Digital Q control for enhanced measurement capability in cantilever-based instruments | Dan Bocek | 2013-06-11 |