Issued Patents All Time
Showing 25 most recent of 50 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| RE49997 | Metrological scanning probe microscope | Aleksander Labuda, Deron Walters, Jason Cleveland | 2024-06-04 |
| 10705114 | Metrological scanning probe microscope | Aleksander Labuda, Deron Walters, Jason Cleveland | 2020-07-07 |
| 10556793 | Thermal measurements using multiple frequency atomic force microscopy | Anil Gannepalli | 2020-02-11 |
| 10557865 | Quantitative measurements using multiple frequency atomic force microscopy | Jason Bemis | 2020-02-11 |
| 10444258 | AM/FM measurements using multiple frequency atomic force microscopy | Jason Bemis, Aleksander Labuda | 2019-10-15 |
| 10416190 | Modular atomic force microscope with environmental controls | Mario Viani, Maarten Rutgers, Jason Cleveland, Jim Hodgson | 2019-09-17 |
| 10338096 | Metrological scanning probe microscope | Aleksander Labuda, Deron Walters, Jason Cleveland | 2019-07-02 |
| 10215773 | Material property measurements using multiple frequency atomic force microscopy | Roger C. Callahan | 2019-02-26 |
| 10054612 | Optical beam positioning unit for atomic force microscope | Aleksander Labuda, Jason Cleveland, Deron Walters | 2018-08-21 |
| 9921242 | Automated atomic force microscope and the operation thereof | Roger C. Callahan, Frank Stetter, Ted Limpoco, Sophia Hohlbauch, Jason Bemis +2 more | 2018-03-20 |
| 9841436 | AM/FM measurements using multiple frequency of atomic force microscopy | Jason Bemis, Aleksander Labuda | 2017-12-12 |
| 9804193 | Metrological scanning probe microscope | Aleksander Labuda, Deron Walters, Jason Cleveland | 2017-10-31 |
| 9696342 | Quantitative measurements using multiple frequency atomic force microscopy | Jason Bemis | 2017-07-04 |
| 9604846 | Thermal measurements using multiple frequency atomic force microscopy | Anil Gannepalli | 2017-03-28 |
| 9581616 | Modular atomic force microscope with environmental controls | Mario Viani, Maarten Rutgers, Jason Cleveland, Jim Hodgson | 2017-02-28 |
| 9453857 | AM/FM measurements using multiple frequency of atomic force microscopy | Jason Bemis, Aleksander Labuda | 2016-09-27 |
| 9383386 | Optical beam positioning unit for atomic force microscope | Aleksander Labuda, Jason Cleveland, Deron Walters | 2016-07-05 |
| 9383388 | Automated atomic force microscope and the operation thereof | Roger C. Callahan, Frank Stetter, Ted Limpoco, Sophia Hohlbach, Jason Bemis +1 more | 2016-07-05 |
| 9366693 | Variable density scanning | Roger C. Callahan | 2016-06-14 |
| 9297827 | Quantitative measurements using multiple frequency atomic force microscopy | Jason Bemis | 2016-03-29 |
| 9097737 | Modular atomic force microscope with environmental controls | Mario Viani, Maarten Rutgers, Jason Cleveland, Jim Hodgson | 2015-08-04 |
| 9069007 | Multiple frequency atomic force microscopy | — | 2015-06-30 |
| 9063042 | Nanoindenter | Flavio Alejandro Bonilla, Jason Cleveland, Tim Sauter | 2015-06-23 |
| 8763475 | Active damping of high speed scanning probe microscope components | — | 2014-07-01 |
| 8677809 | Thermal measurements using multiple frequency atomic force microscopy | Anil Gannepalli | 2014-03-25 |