Issued Patents All Time
Showing 1–14 of 14 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12055560 | Automated optimization of AFM light source positioning | Jason Bemis, David Aue | 2024-08-06 |
| RE49997 | Metrological scanning probe microscope | Deron Walters, Jason Cleveland, Roger Proksch | 2024-06-04 |
| 11644478 | Automated optimization of AFM light source positioning | Jason Bemis, David Aue | 2023-05-09 |
| 10705114 | Metrological scanning probe microscope | Deron Walters, Jason Cleveland, Roger Proksch | 2020-07-07 |
| 10444258 | AM/FM measurements using multiple frequency atomic force microscopy | Roger Proksch, Jason Bemis | 2019-10-15 |
| 10338096 | Metrological scanning probe microscope | Deron Walters, Jason Cleveland, Roger Proksch | 2019-07-02 |
| 10054612 | Optical beam positioning unit for atomic force microscope | Jason Cleveland, Deron Walters, Roger Proksch | 2018-08-21 |
| 9841436 | AM/FM measurements using multiple frequency of atomic force microscopy | Roger Proksch, Jason Bemis | 2017-12-12 |
| 9804193 | Metrological scanning probe microscope | Deron Walters, Jason Cleveland, Roger Proksch | 2017-10-31 |
| 9671424 | Methods and systems for optimizing frequency modulation atomic force microscopy | Peter Grutter, Yoichi Miyahara, William Paul, Antoine Roy-Gobeil | 2017-06-06 |
| 9453857 | AM/FM measurements using multiple frequency of atomic force microscopy | Roger Proksch, Jason Bemis | 2016-09-27 |
| 9383386 | Optical beam positioning unit for atomic force microscope | Jason Cleveland, Deron Walters, Roger Proksch | 2016-07-05 |
| 9075235 | Method and system for optical microscopy | Dilson Rassier, Albert Kalganov | 2015-07-07 |
| 8667611 | Method and apparatus for measuring cantilever deflection in constrained spaces | Dilson Rassier | 2014-03-04 |