Issued Patents All Time
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10556793 | Thermal measurements using multiple frequency atomic force microscopy | Roger Proksch | 2020-02-11 |
| 9604846 | Thermal measurements using multiple frequency atomic force microscopy | Roger Proksch | 2017-03-28 |
| 8677809 | Thermal measurements using multiple frequency atomic force microscopy | Roger Proksch | 2014-03-25 |
| 8370960 | Modular atomic force microscope | Roger Proksch, Mario Viani, Jason Cleveland, Maarten Rutgers, Matthew Klonowski +4 more | 2013-02-05 |