Issued Patents All Time
Showing 1–14 of 14 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9389244 | Vertical embedded sensor and process of manufacturing thereof | Jeremy Goeckeritz, Gary D. Aden, Josiah F. Willard | 2016-07-12 |
| 8857247 | Probe for a scanning probe microscope and method of manufacture | Kevin Kjoller, Nihat Okulan | 2014-10-14 |
| 8828243 | Scanning probe having integrated silicon tip with cantilever | Rakesh Poddar | 2014-09-09 |
| 8397555 | Scanning probe devices | — | 2013-03-19 |
| 8003534 | Method of forming semiconductor devices in wafer assembly | — | 2011-08-23 |
| 7913544 | Scanning probe devices and methods for fabricating same | — | 2011-03-29 |
| 7884445 | Semiconductor device in wafer assembly | — | 2011-02-08 |
| 7370515 | Probes for use in scanning probe microscopes and methods of fabricating such probes | Nihat Okulan | 2008-05-13 |
| 7334460 | Method and apparatus of manipulating a sample | Kevin Kjoller, Kenneth Babcock, Michael Harris | 2008-02-26 |
| 7210330 | Methods of fabricating structures for characterizing tip shape of scanning probe microscope probes and structures fabricated thereby | Nihat Okulan | 2007-05-01 |
| 7096711 | Methods of fabricating structures for characterizing tip shape of scanning probe microscope probes and structures fabricated thereby | Nihat Okulan | 2006-08-29 |
| 7040147 | Method and apparatus for manipulating a sample | Kevin Kjoller, Kenneth Babcock, Michael Harris | 2006-05-09 |
| 6862921 | Method and apparatus for manipulating a sample | Kevin Kjoller, Kenneth Babcock, Michael Harris | 2005-03-08 |
| 6016693 | Microfabrication of cantilevers using sacrificial templates | Mario B. Viani, Paul K. Hansma, Mark A. Wendman, Hal J. Morrett | 2000-01-25 |