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Vertical embedded sensor and process of manufacturing thereof |
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2016-07-12 |
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Probe for a scanning probe microscope and method of manufacture |
Kevin Kjoller, Nihat Okulan |
2014-10-14 |
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Scanning probe having integrated silicon tip with cantilever |
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2014-09-09 |
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Scanning probe devices |
— |
2013-03-19 |
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Method of forming semiconductor devices in wafer assembly |
— |
2011-08-23 |
| 7913544 |
Scanning probe devices and methods for fabricating same |
— |
2011-03-29 |
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Semiconductor device in wafer assembly |
— |
2011-02-08 |
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Probes for use in scanning probe microscopes and methods of fabricating such probes |
Nihat Okulan |
2008-05-13 |
| 7334460 |
Method and apparatus of manipulating a sample |
Kevin Kjoller, Kenneth Babcock, Michael Harris |
2008-02-26 |
| 7210330 |
Methods of fabricating structures for characterizing tip shape of scanning probe microscope probes and structures fabricated thereby |
Nihat Okulan |
2007-05-01 |
| 7096711 |
Methods of fabricating structures for characterizing tip shape of scanning probe microscope probes and structures fabricated thereby |
Nihat Okulan |
2006-08-29 |
| 7040147 |
Method and apparatus for manipulating a sample |
Kevin Kjoller, Kenneth Babcock, Michael Harris |
2006-05-09 |
| 6862921 |
Method and apparatus for manipulating a sample |
Kevin Kjoller, Kenneth Babcock, Michael Harris |
2005-03-08 |
| 6016693 |
Microfabrication of cantilevers using sacrificial templates |
Mario B. Viani, Paul K. Hansma, Mark A. Wendman, Hal J. Morrett |
2000-01-25 |