Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11719719 | Metrology probe with built-in angle and method of fabrication thereof | Jeffrey Wong, Joseph S. Fragala, Weijie Wang, Deepkishore Mukhopadhyay, Xing Zhao | 2023-08-08 |
| 8828243 | Scanning probe having integrated silicon tip with cantilever | Ami Chand | 2014-09-09 |
| 8819068 | Automating creation or modification of database objects | Korey Allen Knote, Kumar S Gounder, Mark J Golazeski, Deenadayal S Yakkali, Jay Borja +1 more | 2014-08-26 |