Issued Patents All Time
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10509873 | System and method for automated model calibration, sensitivity analysis, and optimization | — | 2019-12-17 |
| 9946818 | System and method for automated model calibration, sensitivity analysis, and optimization | — | 2018-04-17 |
| 6871527 | Measurement head for atomic force microscopy and other applications | Paul K. Hansma, Barney Drake, James A. Thompson, Johannes Kindt | 2005-03-29 |