ST

Stanislav S. Todorov

VA Varian Semiconductor Equipment Associates: 10 patents #75 of 513Top 15%
Applied Materials: 3 patents #2,994 of 7,310Top 45%
📍 Topsfield, MA: #23 of 151 inventorsTop 20%
🗺 Massachusetts: #9,595 of 88,656 inventorsTop 15%
Overall (All Time): #361,524 of 4,157,543Top 9%
13
Patents All Time

Issued Patents All Time

Showing 1–13 of 13 patents

Patent #TitleCo-InventorsDate
12247283 Method and apparatus for controlled ion implantation Alexander Eidukonis, Hans-Joachim L. Gossmann, Dennis Rodier, Richard M. White, Wei Zhao +2 more 2025-03-11
11830739 Techniques to increase CMOS image sensor well depth by cyrogenic ion channeling of ultra high energy ions Hans-Joachim L. Gossmann, Hiroyuki Ito 2023-11-28
10658156 System and method for improved scanned spot beam Jeffrey Bruce Morse, John C. Sawyer 2020-05-19
10081861 Selective processing of a workpiece Morgan Evans, Daniel Distaso, Mark R. Amato, William Davis Lee, Jillian Reno 2018-09-25
9738968 Apparatus and method for controlling implant process George M. Gammel, Morgan Evans, Norman E. Hussey, Gregory Gibilaro 2017-08-22
9299564 Ion implant for defect control Andrew Waite 2016-03-29
9006692 Apparatus and techniques for controlling ion implantation uniformity George M. Gammel, Richard Allen Sprenkle, Norman E. Hussey, Frank Sinclair, Shengwu Chang +3 more 2015-04-14
8853653 Apparatus and techniques for controlling ion implantation uniformity George M. Gammel, Richard Allen Sprenkle, Norman E. Hussey, Frank Sinclair, Shengwu Chang +3 more 2014-10-07
8722431 FinFET device fabrication using thermal implantation Nilay A. Pradhan, Kurt Decker-Lucke, Klaus Petry, Benjamin Colombeau, Baonian Guo 2014-05-13
8617955 Method and system for forming low contact resistance device Andrew Waite, Yuri Erokhin 2013-12-31
8450194 Method to modify the shape of a cavity using angled implantation Andrew Waite, Younki Kim 2013-05-28
7413596 Method and apparatus for the production of purified liquids and vapors Wilhelm P. Platow, John B. Cracchiolo, Jaime M. Reyes 2008-08-19
7397049 Determining ion beam parallelism using refraction method Raymond Callahan, David Olson, Wilhelm P. Platow 2008-07-08