Issued Patents All Time
Showing 1–21 of 21 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12278284 | Power semiconductor devices including a trenched gate and methods of forming such devices | Daniel Jenner Lichtenwalner, Sei-Hyung Ryu, Naeem Islam, Woongsun Kim, Matthew N. McCain | 2025-04-15 |
| 12159909 | Power semiconductor device with reduced strain | Daniel Jenner Lichtenwalner, Edward Robert Van Brunt, Thomas E. Harrington, III, Shadi Sabri, Brett Hull +1 more | 2024-12-03 |
| 11869948 | Power semiconductor device with reduced strain | Daniel Jenner Lichtenwalner, Edward Robert Van Brunt, Thomas E. Harrington, III, Shadi Sabri, Brett Hull +1 more | 2024-01-09 |
| 11640990 | Power semiconductor devices including a trenched gate and methods of forming such devices | Daniel Jenner Lichtenwalner, Sei-Hyung Ryu, Naeem Islam, Woongsun Kim, Matt N. McCain | 2023-05-02 |
| 8093716 | Contact fuse which does not touch a metal layer | Robert L. Pitts, Bryan Sheffield, Roger Griesmer | 2012-01-10 |
| 7906405 | Polysilicon structures resistant to laser anneal lightpipe waveguide effects | Ajit Shanware | 2011-03-15 |
| 7888776 | Capacitor-based method for determining and characterizing scribe seal integrity and integrity loss | Ennis T. Ogawa, Honglin Guo | 2011-02-15 |
| 7628021 | Solid state heat pump | — | 2009-12-08 |
| 7612454 | Semiconductor device with improved contact fuse | Honglin Guo, Dongmei Lei, Brian E. Goodlin | 2009-11-03 |
| 7413980 | Semiconductor device with improved contact fuse | Honglin Guo, Dongmei Lei, Brian E. Goodlin | 2008-08-19 |
| 7402514 | Line-to-line reliability enhancement using a dielectric liner for a low dielectric constant interlevel and intralevel (or intermetal and intrametal) dielectric layer | Robert Tsu, William R. McKee, Thomas D. Bonifield | 2008-07-22 |
| 7033924 | Versatile system for diffusion limiting void formation | Ennis T. Ogawa | 2006-04-25 |
| 6967499 | Dual ramp rate dielectric breakdown testing methodology | Gaddi S. Haase | 2005-11-22 |
| 6965136 | Photon-blocking layer | Yaojian Leng, Honglin Guo | 2005-11-15 |
| 6919219 | Photon-blocking layer | Yaojian Leng, Honglin Guo | 2005-07-19 |
| 6737351 | Versatile system for diffusion limiting void formation | Ennis T. Ogawa | 2004-05-18 |
| 6091114 | Method and apparatus for protecting gate oxide from process-induced charging effects | Homi Mogul, Bob D. Strong, Anand Seshadri | 2000-07-18 |
| 5963779 | Integrated circuit using a back gate voltage for burn-in operations | Anthony Leigh, Kenan J. Dickerson | 1999-10-05 |
| 4816425 | Polycide process for integrated circuits | — | 1989-03-28 |
| 4700215 | Polycide electrodes for integrated circuits | — | 1987-10-13 |
| 4650922 | Thermally matched mounting substrate | — | 1987-03-17 |