| 12354922 |
Contamination detection method |
Robert M. Higgins |
2025-07-08 |
| 12317518 |
Isolation device with safety fuse |
Thomas D. Bonifield |
2025-05-27 |
| 12317519 |
Contaminant collection on SOI |
Zachary K. Lee, Jingjing Chen |
2025-05-27 |
| 12046602 |
Contaminant collection on SOI |
Frank J. Sweeney |
2024-07-23 |
| 12009336 |
Packages with electrical fuses |
Mahmud Halim Chowdhury, Amin Ahmad Sijelmassi, Murali Kittappa, Anindya Poddar, Joe Adam Garcia +1 more |
2024-06-11 |
| 11901462 |
Contaminant collection on SOI |
Zachary K. Lee, Jingjing Chen |
2024-02-13 |
| 11881462 |
Reliable lateral flux capacitor design |
— |
2024-01-23 |
| 11424183 |
IC with thin film resistor with metal walls |
Qi-Zhong Hong, Benjamin James Timmer, Gregory B. Shinn |
2022-08-23 |
| 11227852 |
Integrated circuit packaging |
Jason Chien, Byron Lovell Williams, Jeffrey Alan West, Anderson Li, Arvin Nono Verdeflor |
2022-01-18 |
| 11069627 |
Scribe seals and methods of making |
Thomas D. Bonifield, Jeffrey Alan West, Byron Lovell Williams |
2021-07-20 |
| 10992293 |
Device with isolation barrier and fault detection |
Xiong Li, William W. Toth, Danyang Zhu |
2021-04-27 |
| 10784193 |
IC with thin film resistor with metal walls |
Qi-Zhong Hong, Benjamin James Timmer, Gregory B. Shinn |
2020-09-22 |
| 10629562 |
Integrated circuit packaging |
Jason Chien, Byron Lovell Williams, Jeffrey Alan West, Anderson Li, Arvin Nono Verdeflor |
2020-04-21 |
| 9875846 |
Heated capacitor and method of forming the heated capacitor |
Byron Lovell Williams |
2018-01-23 |
| 9793106 |
Reliability improvement of polymer-based capacitors by moisture barrier |
Tim A. Taylor, Jeff West, Ricky Alan Jackson, Byron Lovell Williams |
2017-10-17 |
| 9293254 |
Heated capacitor and method of forming the heated capacitor |
Byron Lovell Williams |
2016-03-22 |
| 7888776 |
Capacitor-based method for determining and characterizing scribe seal integrity and integrity loss |
Ennis T. Ogawa, Joe W. McPherson |
2011-02-15 |
| 7612454 |
Semiconductor device with improved contact fuse |
Dongmei Lei, Brian E. Goodlin, Joe W. McPherson |
2009-11-03 |
| 7413980 |
Semiconductor device with improved contact fuse |
Dongmei Lei, Brian E. Goodlin, Joe W. McPherson |
2008-08-19 |
| 6965136 |
Photon-blocking layer |
Yaojian Leng, Joe W. McPherson |
2005-11-15 |
| 6919219 |
Photon-blocking layer |
Yaojian Leng, Joe W. McPherson |
2005-07-19 |
| 6730597 |
Pre-ECD wet surface modification to improve wettability and reduced void defect |
Jiong-Ping Lu, Linlin Chen, David Gonzalez |
2004-05-04 |