Issued Patents All Time
Showing 26–36 of 36 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9064807 | Integrated platform for improved wafer manufacturing quality | Tsai-Pao Su, Wen-Chang Tsai, Chia-Wen Li, Yu-Yen Hsu | 2015-06-23 |
| 9048089 | Apparatus to improve internal wafer temperature profile | Yu-Yen Hsu, Chun-Li Chou | 2015-06-02 |
| 8926762 | Apparatus and methods for movable megasonic wafer probe | Ying-Hsueh Chang Chien, Ming-Hsi Yeh, Chi-Ming Yang, Chin-Hsiang Lin | 2015-01-06 |
| 8916429 | Aqueous cleaning techniques and compositions for use in semiconductor device manufacturing | Chun-Li Chou, Pei-Hung Chen, Jui-Ping Chuang | 2014-12-23 |
| 8616821 | Integrated apparatus to assure wafer quality and manufacturability | Chi-Ming Yang, Ming-Tsao Chiang, Yu-Fen Tzeng, Chin-Hsiang Lin | 2013-12-31 |
| 8518634 | Cleaning process for semiconductor device fabrication | Ming-Hsi Yeh, Yu-Fu Lin, Chi-Ming Yang, Chin-Hsiang Lin | 2013-08-27 |
| 8105851 | Nitride film wet stripping | Chung-Ru Yang, Chi-Ming Yang | 2012-01-31 |
| 7776757 | Method of fabricating high-k metal gate devices | Simon Su-Horng Lin, Yu-Ming Lee, Chi-Ming Yang, Chyi Shyuan Chern, Chin-Hsiang Lin | 2010-08-17 |
| 7585737 | Method of manufacturing double diffused drains in semiconductor devices | Hung-Lin Chen | 2009-09-08 |
| 6703320 | Successful and easy method to remove polysilicon film | — | 2004-03-09 |
| 6455405 | Using implantation method to control gate oxide thickness on dual oxide semiconductor devices | — | 2002-09-24 |