Issued Patents All Time
Showing 101–116 of 116 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9734572 | System and method for defect analysis of a substrate | Yao-Wei Tien, Ming-Yi Lee | 2017-08-15 |
| 9480965 | Method for preparing granulated inorganic adsorbent for radionuclides | Li-Ching Chuang, Jen-Chieh Chung, Kou-Min Lin, Sheng-Wei Chiang, Kuang-Li Chien +2 more | 2016-11-01 |
| 9409147 | Method for granulation of absorbent and adsorbent granules prepared by the same | Sheng-Wei Chiang, Kuang-Li Chien, Jen-Chieh Chung, Shih-Che Huang, Kou-Min Lin | 2016-08-09 |
| 8965102 | System and method for defect analysis of a substrate | Yan-Wei Tien, Ming-Yi Lee | 2015-02-24 |
| 8870431 | Light mixing module | Hui-Hsiung Lin, Chiun-Lern Fu, Hsiao-Wen Hung, Wen-Hsun Yang, Wen-Jung Chen | 2014-10-28 |
| 8545062 | Light uniformization structure and light emitting module | Hui-Hsiung Lin, Wen-Hsun Yang, Han-Tsung Hsueh | 2013-10-01 |
| 8189260 | Color dividing optical device and image apparatus with the application | Hui-Hsiung Lin | 2012-05-29 |
| 8048589 | Phase shift photomask performance assurance method | Yi-Ming Dai, Chien-Hsing Wu, Li-Kong Turn | 2011-11-01 |
| 7968258 | System and method for photolithography in semiconductor manufacturing | Wei-Yu Su, Yi-Ming Dai, Chun-Hung Kung | 2011-06-28 |
| 7541311 | Vermiculite supported catalyst for CO preferential oxidation and the process of preparing the same | CHAO-YUH CHEN, Ching-Tsuen Huang, Ching-Tu Chang | 2009-06-02 |
| 7333173 | Method to simplify twin stage scanner OVL machine matching | Shun-Jiang Chiang, Heng-Hsin Liu | 2008-02-19 |
| 7301604 | Method to predict and identify defocus wafers | Chun-Hung Lin, Louie Liu, Li-Kong Turn, Ham-Ming Hsieh, Yi-Chang Sung +1 more | 2007-11-27 |
| 6975407 | Method of wafer height mapping | Chun-Sheng Wang, Yi-Chang Sung, Li-Kong Turn, Louie Liu | 2005-12-13 |
| 6468704 | Method for improved photomask alignment after epitaxial process through 90° orientation change | Yih-Ann Lin, Sheng-Liang Pan, Cheng-Yu Chu, Kuo-Liang Lu, Yu-Hsi Wang | 2002-10-22 |
| 6242331 | Method to reduce device contact resistance using a hydrogen peroxide treatment | Cheng-Yu Chu, Te-Fu Tseng, Chai-Der Chang | 2001-06-05 |
| 6143579 | Efficient method for monitoring gate oxide damage related to plasma etch chamber processing history | Chia-Der Chang, Dean E. Lin, Sheng-Liang Pan | 2000-11-07 |