Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9269135 | Defect management systems and methods | Pei-Yi Su, You-Hong Huang, Ching-Cheng Wang | 2016-02-23 |
| 8965102 | System and method for defect analysis of a substrate | Chi-Hung Liao, Ming-Yi Lee | 2015-02-24 |