Issued Patents All Time
Showing 1–15 of 15 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12352811 | Validating test patterns ported between different levels of a hierarchical design of an integrated circuit | Andrea Costa, Salvatore Talluto, Sorin Ioan Popa, Leela Krishna Thota | 2025-07-08 |
| 11132484 | Controlling clocks and resets in a logic built in self-test | Salvatore Talluto | 2021-09-28 |
| 9157961 | Two-level compression through selective reseeding | Peter Wohl, John A. Waicukauski, Gregory A. Maston | 2015-10-13 |
| 8645780 | Fully X-tolerant, very high scan compression scan test systems and techniques | Peter Wohl, John A. Waicukauski | 2014-02-04 |
| 8464115 | Fully X-tolerant, very high scan compression scan test systems and techniques | Peter Wohl, John A. Waicukauski | 2013-06-11 |
| 7979763 | Fully X-tolerant, very high scan compression scan test systems and techniques | Peter Wohl, John A. Waicukauski | 2011-07-12 |
| 7958472 | Increasing scan compression by using X-chains | Peter Wohl, John A. Waicukauski, Yasunari Kanzawa | 2011-06-07 |
| 7900105 | Dynamically reconfigurable shared scan-in test architecture | Rohit Kapur, Nodari Sitchinava, Samitha Samaranayake, Emil Gizdarski, Suryanarayana Duggirala +1 more | 2011-03-01 |
| 7836368 | Dynamically reconfigurable shared scan-in test architecture | Rohit Kapur, Nodari Sitchinava, Samitha Samaranayake, Emil Gizdarski, Suryanarayana Duggirala +1 more | 2010-11-16 |
| 7836367 | Dynamically reconfigurable shared scan-in test architecture | Rohit Kapur, Nodari Sitchinava, Samitha Samaranayake, Emil Gizdarski, Suryanarayana Duggirala +1 more | 2010-11-16 |
| 7823034 | Pipeline of additional storage elements to shift input/output data of combinational scan compression circuit | Peter Wohl, John A. Waicukauski | 2010-10-26 |
| 7774663 | Dynamically reconfigurable shared scan-in test architecture | Rohit Kapur, Nodari Sitchinava, Samitha Samaranayake, Emil Gizdarski, Suryanarayana Duggirala +1 more | 2010-08-10 |
| 7743299 | Dynamically reconfigurable shared scan-in test architecture | Rohit Kapur, Nodari Sitchinava, Samitha Samaranayake, Emil Gizdarski, Suryanarayana Duggirala +1 more | 2010-06-22 |
| 7596733 | Dynamically reconfigurable shared scan-in test architecture | Rohit Kapur, Nodari Sitchinava, Samitha Samaranayake, Emil Gizdarski, Suryanarayana Duggirala +1 more | 2009-09-29 |
| 7418640 | Dynamically reconfigurable shared scan-in test architecture | Rohit Kapur, Nodari Sitchinava, Samitha Samaranayake, Emil Gizdarski, Suryanarayana Duggirala +1 more | 2008-08-26 |