Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
FN

Frederic J. Neuveux — 15 Patents

SYSynopsys: 15 patents #39 of 2,302Top 2%
Grenoble, FR: #164 of 3,293 inventorsTop 5%
Overall (All Time): #307,048 of 4,157,543Top 8%
15 Patents All Time
Frederic J. Neuveux has been granted 15 US patents while listed as an inventor at Synopsys. The first was granted in 2008 and the most recent in July 2025. Frederic J. Neuveux ranks #307,048 of 4,157,543 US inventors in our database (top 7.4%). Patent records list Frederic J. Neuveux in Grenoble, FR.

Issued Patents All Time

Showing 1–15 of 15 patents

Patent #TitleCo-InventorsDateApprox Value ⓘ
12352811 Validating test patterns ported between different levels of a hierarchical design of an integrated circuit Andrea Costa, Salvatore Talluto, Sorin Ioan Popa, Leela Krishna Thota 2025-07-08
11132484 Controlling clocks and resets in a logic built in self-test Salvatore Talluto 2021-09-28 $89,414,000
9157961 Two-level compression through selective reseeding Peter Wohl, John A. Waicukauski, Gregory A. Maston 2015-10-13 $21,059,000
8645780 Fully X-tolerant, very high scan compression scan test systems and techniques Peter Wohl, John A. Waicukauski 2014-02-04 $6,201,000
8464115 Fully X-tolerant, very high scan compression scan test systems and techniques Peter Wohl, John A. Waicukauski 2013-06-11 $3,959,000
7979763 Fully X-tolerant, very high scan compression scan test systems and techniques Peter Wohl, John A. Waicukauski 2011-07-12 $5,018,000
7958472 Increasing scan compression by using X-chains Peter Wohl, John A. Waicukauski, Yasunari Kanzawa 2011-06-07 $5,504,000
7900105 Dynamically reconfigurable shared scan-in test architecture Rohit Kapur, Nodari Sitchinava, Samitha Samaranayake, Emil Gizdarski, Suryanarayana Duggirala +1 more 2011-03-01 $2,192,000
7836368 Dynamically reconfigurable shared scan-in test architecture Rohit Kapur, Nodari Sitchinava, Samitha Samaranayake, Emil Gizdarski, Suryanarayana Duggirala +1 more 2010-11-16 $2,454,000
7836367 Dynamically reconfigurable shared scan-in test architecture Rohit Kapur, Nodari Sitchinava, Samitha Samaranayake, Emil Gizdarski, Suryanarayana Duggirala +1 more 2010-11-16 $2,454,000
7823034 Pipeline of additional storage elements to shift input/output data of combinational scan compression circuit Peter Wohl, John A. Waicukauski 2010-10-26 $7,257,000
7774663 Dynamically reconfigurable shared scan-in test architecture Rohit Kapur, Nodari Sitchinava, Samitha Samaranayake, Emil Gizdarski, Suryanarayana Duggirala +1 more 2010-08-10 $3,978,000
7743299 Dynamically reconfigurable shared scan-in test architecture Rohit Kapur, Nodari Sitchinava, Samitha Samaranayake, Emil Gizdarski, Suryanarayana Duggirala +1 more 2010-06-22 $6,856,000
7596733 Dynamically reconfigurable shared scan-in test architecture Rohit Kapur, Nodari Sitchinava, Samitha Samaranayake, Emil Gizdarski, Suryanarayana Duggirala +1 more 2009-09-29 $26,187,000
7418640 Dynamically reconfigurable shared scan-in test architecture Rohit Kapur, Nodari Sitchinava, Samitha Samaranayake, Emil Gizdarski, Suryanarayana Duggirala +1 more 2008-08-26 $6,987,000