FN

Frederic J. Neuveux

SY Synopsys: 15 patents #39 of 2,302Top 2%
Overall (All Time): #309,021 of 4,157,543Top 8%
15
Patents All Time

Issued Patents All Time

Patent #TitleCo-InventorsDate
12352811 Validating test patterns ported between different levels of a hierarchical design of an integrated circuit Andrea Costa, Salvatore Talluto, Sorin Ioan Popa, Leela Krishna Thota 2025-07-08
11132484 Controlling clocks and resets in a logic built in self-test Salvatore Talluto 2021-09-28
9157961 Two-level compression through selective reseeding Peter Wohl, John A. Waicukauski, Gregory A. Maston 2015-10-13
8645780 Fully X-tolerant, very high scan compression scan test systems and techniques Peter Wohl, John A. Waicukauski 2014-02-04
8464115 Fully X-tolerant, very high scan compression scan test systems and techniques Peter Wohl, John A. Waicukauski 2013-06-11
7979763 Fully X-tolerant, very high scan compression scan test systems and techniques Peter Wohl, John A. Waicukauski 2011-07-12
7958472 Increasing scan compression by using X-chains Peter Wohl, John A. Waicukauski, Yasunari Kanzawa 2011-06-07
7900105 Dynamically reconfigurable shared scan-in test architecture Rohit Kapur, Nodari Sitchinava, Samitha Samaranayake, Emil Gizdarski, Suryanarayana Duggirala +1 more 2011-03-01
7836368 Dynamically reconfigurable shared scan-in test architecture Rohit Kapur, Nodari Sitchinava, Samitha Samaranayake, Emil Gizdarski, Suryanarayana Duggirala +1 more 2010-11-16
7836367 Dynamically reconfigurable shared scan-in test architecture Rohit Kapur, Nodari Sitchinava, Samitha Samaranayake, Emil Gizdarski, Suryanarayana Duggirala +1 more 2010-11-16
7823034 Pipeline of additional storage elements to shift input/output data of combinational scan compression circuit Peter Wohl, John A. Waicukauski 2010-10-26
7774663 Dynamically reconfigurable shared scan-in test architecture Rohit Kapur, Nodari Sitchinava, Samitha Samaranayake, Emil Gizdarski, Suryanarayana Duggirala +1 more 2010-08-10
7743299 Dynamically reconfigurable shared scan-in test architecture Rohit Kapur, Nodari Sitchinava, Samitha Samaranayake, Emil Gizdarski, Suryanarayana Duggirala +1 more 2010-06-22
7596733 Dynamically reconfigurable shared scan-in test architecture Rohit Kapur, Nodari Sitchinava, Samitha Samaranayake, Emil Gizdarski, Suryanarayana Duggirala +1 more 2009-09-29
7418640 Dynamically reconfigurable shared scan-in test architecture Rohit Kapur, Nodari Sitchinava, Samitha Samaranayake, Emil Gizdarski, Suryanarayana Duggirala +1 more 2008-08-26