Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Dynamically reconfigurable shared scan-in test architecture

Dynamically reconfigurable shared scan-in test architecture

US Patent 7743299 · Granted Jun 22, 2010

Estimated economic value: $6,856,000 ⓘ

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Validating test patterns ported between different levels of a hierarchical desig2025
Machine-learning-based design-for-test (DFT) recommendation system for improving2025
Scan chain formation for improving chain resolution2025
Testable time-to-digital converter2024
Machine-learning-based design-for-test (DFT) recommendation system for improving2023
Single-pass diagnosis for multiple chain defects2023
Localization of multiple scan chain defects per scan chain2023
System for on-demand high-capacity ride-sharing via dynamic trip-vehicle assignm2023
Cell-aware defect characterization by considering inter-cell timing2022
Integrated circuit design modification for localization of scan chain defects2022
Layout-aware test pattern generation and fault detection2022
Controlling clocks and resets in a logic built in self-test2021