Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Localization of multiple scan chain defects per scan chain

Localization of multiple scan chain defects per scan chain

US Patent 11740288 · Granted Aug 29, 2023

Estimated economic value: $101,295,000 ⓘ

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Scan chain formation for improving chain resolution2025
Testable time-to-digital converter2024
Single-pass diagnosis for multiple chain defects2023
Cell-aware defect characterization by considering inter-cell timing2022
Integrated circuit design modification for localization of scan chain defects2022
Reducing X-masking effect for linear time compactors2021
Power-aware dynamic encoding2019
Augmented power-aware decompressor2019
Diagnosis and debug with truncated simulation2016
Diagnosis and debug using truncated simulation2015
Linear decompressor with two-step dynamic encoding2015
synthesizing circular decompressors2014