Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
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Fadi Maamari — 14 Patents

SYSynopsys: 5 patents #244 of 2,302Top 15%
LOLogicvision: 4 patents #5 of 30Top 20%
ATAtrenta: 2 patents #19 of 68Top 30%
ATAT&T: 2 patents #7,295 of 18,772Top 40%
San Jose, CA: #4,673 of 32,062 inventorsTop 15%
California: #43,920 of 386,348 inventorsTop 15%
Overall (All Time): #332,869 of 4,157,543Top 9%
14 Patents All Time
Fadi Maamari has been granted 14 US patents while listed as an inventor at Synopsys. The first was granted in 1995 and the most recent in June 2025. Fadi Maamari ranks #332,869 of 4,157,543 US inventors in our database (top 8.0%). Patent records list Fadi Maamari in San Jose, CA, US.

Issued Patents All Time

Showing 1–14 of 14 patents

Patent #TitleCo-InventorsDateApprox Value ⓘ
12333227 Machine-learning-based design-for-test (DFT) recommendation system for improving automatic test pattern generation (ATPG) quality of results (QoR) Apik A. Zorian, Suryanarayana Duggirala, Mahilchi Milir Vaseekar Kumar, Basim Mohammed Issa Shanyour 2025-06-17
12282063 Scan chain formation for improving chain resolution Emil Gizdarski 2025-04-22
11842134 Automated determinaton of failure mode distribution Shivakumar Shankar Chonnad, Abhishek Chauhan, Jamileh Davoudi 2023-12-12 $201,946,000
11829692 Machine-learning-based design-for-test (DFT) recommendation system for improving automatic test pattern generation (ATPG) quality of results (QOR) Apik A. Zorian, Suryanarayana Duggirala, Mahilchi Milir Vaseekar Kumar, Basim Mohammed Issa Shanyour 2023-11-28 $144,969,000
11288428 Integrated circuit design modification for localization of scan chain defects Emil Gizdarski 2022-03-29 $100,633,000
8788993 Computer system for generating an integrated and unified view of IP-cores for hierarchical analysis of a system on chip (SoC) design Sridhar Gangadharan, Mohammad H. Movahed-Ezazi, Shaker Sarwary, Subir Chandra Ray 2014-07-22
8533647 Method for generating an integrated and unified view of IP-cores for hierarchical analysis of a system on chip (SoC) design Sridhar Gangadharan, Mohammad H. Movahed-Ezazi, Shaker Sarwary, Subir Ray 2013-09-10
7424656 Clocking methodology for at-speed testing of scan circuits with synchronous clocks Benoit Nadeau-Dostie, Jean-Francois Cote 2008-09-09 $325,000
7191374 Method of and program product for performing gate-level diagnosis of failing vectors Sonny Ngai San Shum, Benoit Nadeau-Dostie 2007-03-13 $313,000
6883134 Method and program product for detecting bus conflict and floating bus conditions in circuit designs Sonny Ngai San Shum 2005-04-19 $862,000
6510534 Method and apparatus for testing high performance circuits Benoit Nadeau-Dostie, Dwayne Burek, Jean-Francois Cote 2003-01-21 $741,000
6457161 Method and program product for modeling circuits with latch based design Benoit Nadeau-Dostie, Dwayne Burek 2002-09-24
5420871 Method for maintaining bus integrity during testing Paul Murphy 1995-05-30
5418792 Method for the speedup of test vector generation for digital circuits 1995-05-23