Issued Patents All Time
Showing 1–25 of 42 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12260930 | Memory core characteristic screening method and system thereof | Hyeon Jae Lee, Wol-Jin Lee, Ki Hyung Ryoo, Kwang-Rae Cho, Sun Byeong Yoon | 2025-03-25 |
| 12183411 | Memory interface circuitry and built-in self-testing method | Hyeon Jae Lee, Wol-Jin Lee, Ki Hyung Ryoo, Kwang-Rae Cho, Sun Byeong Yoon | 2024-12-31 |
| 9426890 | Display apparatus | Hyo Jae Jang, Chan Hong Park, Jong Myung Lee, Sun Weon Jeong, Hyeong-sik CHOI | 2016-08-23 |
| 8018899 | Handoff system and method between different kinds of devices, SIP server and operational method of SIP server | Se-Jong Oh, Myung-cul Kim, Kyoung-Hee Lee | 2011-09-13 |
| 7602172 | Test apparatus having multiple head boards at one handler and its test method | Ae-Yong Chung, Sung-Ok Kim, Kyeong-Seon Shin | 2009-10-13 |
| 7492032 | Fuse regions of a semiconductor memory device and methods of fabricating the same | Kwang-kyu Bang, Kun-Gu Lee, Kyoung-Suk Lyu, Kyeong-Seon Shin, Ho-Jeong Choi +1 more | 2009-02-17 |
| 7438563 | Connector for testing a semiconductor package | Young Bae Chung, Hyun-Seop Shim, Jae Il Lee, Hyun-Kyo Seo, Young-Soo An +1 more | 2008-10-21 |
| 7408339 | Test system of semiconductor device having a handler remote control and method of operating the same | Ae-Yong Chung, Eun-Seok Lee, Kyeong-Seon Shin, Dae-Gab Chi, Sung-Ok Kim | 2008-08-05 |
| 7378864 | Test apparatus having multiple test sites at one handler and its test method | Ae-Yong Chung, Sung-Ok Kim, Kyeong-Seon Shin | 2008-05-27 |
| 7327154 | Multichip package test | Young-Gu Shin, Kyoung-Il Heo, Hyoung-Young Lee, Hyuk Kwon, Ki-Bong Ju +1 more | 2008-02-05 |
| 7254757 | Flash memory test system and method capable of test time reduction | Dong-Kyoo Park, Jong Kook Kim, Sang Young Choi, Eun Sik Kim | 2007-08-07 |
| 7230417 | Test system of semiconductor device having a handler remote control and method of operating the same | Ae-Yong Chung, Eun-Seok Lee, Kyeong-Seon Shin, Dae-Gab Chi, Sung-Ok Kim | 2007-06-12 |
| 7227351 | Apparatus and method for performing parallel test on integrated circuit devices | Woo-Il Kim, Hyun-Seop Shim, Hyoung-Young Lee, Young-Ki Kwak, Ki-Bong Ju | 2007-06-05 |
| 7084655 | Burn-in test apparatus for BGA packages using forced heat exhaust | Byung-Jun Min, Woo Jin Kim, Hyun-Seop Shim, Hyun-Geun Iy, Jae Il Lee | 2006-08-01 |
| 7017428 | Test kit for semiconductor package and method for testing semiconductor package using the same | Byoung-jun Min, Hyun-Seop Shim, Hyo-geun Chae | 2006-03-28 |
| 6960908 | Method for electrical testing of semiconductor package that detects socket defects in real time | Ae-Yong Chung, Sung-Ok Kim, Kyeong-Seon Shin, Dae-Gab Chi | 2005-11-01 |
| 6943577 | Multichip package test | Young-Gu Shin, Kyoung-Il Heo, Hyoung-Young Lee, Hyuk Kwon, Ki-Bong Ju +1 more | 2005-09-13 |
| 6922050 | Method for testing a remnant batch of semiconductor devices | Ae-Yong Chung, Sung-Ok Kim, Kyeong-Seon Shin, Dae-Gab Chi | 2005-07-26 |
| 6903567 | Test apparatus having multiple test sites at one handler and its test method | Ae-Yong Chung, Sung-Ok Kim, Kyeong-Seon Shin | 2005-06-07 |
| 6879541 | Integrated circuit with improved output control signal and method for generating improved output control signal | — | 2005-04-12 |
| 6861682 | Laser link structure capable of preventing an upper crack and broadening an energy window of a laser beam, and fuse box using the same | Kyeong-Seon Shin, Sang-Seok Kang, Ho-Jeong Choi, Hyen-wook Ju, Kwang-kyu Bang | 2005-03-01 |
| 6850450 | Fuse box including make-link and redundant address decoder having the same, and method for repairing defective memory cell | Kwang-kyu Bang, Kyeong-Seon Shin, Sang-Seok Kang, Hyen-wook Ju, Ho-Jeong Choi | 2005-02-01 |
| 6842031 | Method of electrically testing semiconductor devices | Gil-Young Koh, Jong-Bok Tcho | 2005-01-11 |
| 6841425 | Wafer treatment method for protecting fuse box of semiconductor chip | Jae Il Lee, Young Moon LEE, Hyo-geun Chae | 2005-01-11 |
| 6813195 | Pipe latch circuit for outputting data with high speed | Ki-Jun Nam | 2004-11-02 |