Issued Patents All Time
Showing 1–14 of 14 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7689876 | Real-time optimized testing of semiconductor device | Ae-Yong Chung, Hwa-cheol Lee, Se-rae Cho | 2010-03-30 |
| 7671361 | Semiconductor device including fuse focus detector, fabricating method thereof and laser repair method using the fuse focus detector | Kwang-kyu Bang, Yong Won Lee, Hyen-wook Ju, Jeong Kyu Kim | 2010-03-02 |
| 7633288 | Method of testing semiconductor devices and handler used for testing semiconductor devices | Ae-Yong Chung, Eun-Seok Lee, Ki-Sang Kang | 2009-12-15 |
| 7602172 | Test apparatus having multiple head boards at one handler and its test method | Ae-Yong Chung, Sung-Ok Kim, Jeong-Ho Bang | 2009-10-13 |
| 7492032 | Fuse regions of a semiconductor memory device and methods of fabricating the same | Kwang-kyu Bang, Kun-Gu Lee, Kyoung-Suk Lyu, Jeong-Ho Bang, Ho-Jeong Choi +1 more | 2009-02-17 |
| 7408339 | Test system of semiconductor device having a handler remote control and method of operating the same | Ae-Yong Chung, Eun-Seok Lee, Jeong-Ho Bang, Dae-Gab Chi, Sung-Ok Kim | 2008-08-05 |
| 7378864 | Test apparatus having multiple test sites at one handler and its test method | Ae-Yong Chung, Sung-Ok Kim, Jeong-Ho Bang | 2008-05-27 |
| 7230417 | Test system of semiconductor device having a handler remote control and method of operating the same | Ae-Yong Chung, Eun-Seok Lee, Jeong-Ho Bang, Dae-Gab Chi, Sung-Ok Kim | 2007-06-12 |
| 6972612 | Semiconductor device with malfunction control circuit and controlling method thereof | Sang-Seok Kang, Ki-Sang Kang | 2005-12-06 |
| 6960908 | Method for electrical testing of semiconductor package that detects socket defects in real time | Ae-Yong Chung, Sung-Ok Kim, Jeong-Ho Bang, Dae-Gab Chi | 2005-11-01 |
| 6922050 | Method for testing a remnant batch of semiconductor devices | Ae-Yong Chung, Sung-Ok Kim, Jeong-Ho Bang, Dae-Gab Chi | 2005-07-26 |
| 6903567 | Test apparatus having multiple test sites at one handler and its test method | Ae-Yong Chung, Sung-Ok Kim, Jeong-Ho Bang | 2005-06-07 |
| 6861682 | Laser link structure capable of preventing an upper crack and broadening an energy window of a laser beam, and fuse box using the same | Jeong-Ho Bang, Sang-Seok Kang, Ho-Jeong Choi, Hyen-wook Ju, Kwang-kyu Bang | 2005-03-01 |
| 6850450 | Fuse box including make-link and redundant address decoder having the same, and method for repairing defective memory cell | Kwang-kyu Bang, Sang-Seok Kang, Hyen-wook Ju, Jeong-Ho Bang, Ho-Jeong Choi | 2005-02-01 |