EL

Eun-Seok Lee

Samsung: 10 patents #13,191 of 75,807Top 20%
RU Research & Business Foundation Sungkyunkwan University: 1 patents #708 of 1,975Top 40%
SU Sungkyunkwan University: 1 patents #16 of 104Top 20%
Overall (All Time): #447,544 of 4,157,543Top 15%
11
Patents All Time

Issued Patents All Time

Showing 1–11 of 11 patents

Patent #TitleCo-InventorsDate
11735427 Polishing apparatus including polishing pad conditioner, non-contact displacement sensor, and data processor Jin Ho Shin, Woo-Mok Son, Nam Hoon Lee, Dong-Eog Kim, Seung-Hun Oh +1 more 2023-08-22
11648644 Polishing pad conditioning apparatus Ja-Eung Koo, Kuen-Byul Kim, Jeong Min Na, Chang-Gil Ryu, Hyeon Dong SONG +2 more 2023-05-16
11222786 Method of manufacture including polishing pad monitoring method and polishing apparatus including polishing pad monitoring device Jin Ho Shin, Woo-Mok Son, Nam Hoon Lee, Dong-Eog Kim, Seung-Hun Oh +1 more 2022-01-11
10718114 High-damping reinforced concrete (RC) lattice beam and substructure using same Chan Kyu Park, Sang Kyung Ahn, Yong K. Kim, Hyun Sup Noh, Young Kee Lew +2 more 2020-07-21
10340158 Substrate cleaning apparatus Chang-Gil Ryu, Geun-Young Song, Jae Chang Lee, Yun-Seok Choi, Jin-Suk Hong 2019-07-02
9772296 Method of inspecting a surface of a substrate and apparatus for performing the same Byung-Bok Kang, Seok Min Kang, Bon-Ok Koo, Kyoung Hwan Kim, Myung-Woo Kim +5 more 2017-09-26
9279690 Vehicle navigation apparatus and method of determining trajectory of vehicle Jaehoon Jeong 2016-03-08
8866636 Method and apparatus for providing traffic information service using a mobile communication system Je-Hwan Oh, Se-Ra Jang, Hyun-Sang Youn, Gil-Jong Yoo, Jong-Sun Pyo +1 more 2014-10-21
7633288 Method of testing semiconductor devices and handler used for testing semiconductor devices Ae-Yong Chung, Ki-Sang Kang, Kyeong-Seon Shin 2009-12-15
7408339 Test system of semiconductor device having a handler remote control and method of operating the same Ae-Yong Chung, Jeong-Ho Bang, Kyeong-Seon Shin, Dae-Gab Chi, Sung-Ok Kim 2008-08-05
7230417 Test system of semiconductor device having a handler remote control and method of operating the same Ae-Yong Chung, Jeong-Ho Bang, Kyeong-Seon Shin, Dae-Gab Chi, Sung-Ok Kim 2007-06-12