Issued Patents All Time
Showing 1–10 of 10 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12072370 | Semiconductor package test apparatus and method | Min Woo KIM, Ho-gyung Kim, Dahm Yu, Jae-Hyun Kim | 2024-08-27 |
| 9880418 | Display apparatus | Jae Kwon Lee, Dea Woo Ryu, Yong Gil Lee, Chang Ho Cho | 2018-01-30 |
| 7602172 | Test apparatus having multiple head boards at one handler and its test method | Ae-Yong Chung, Kyeong-Seon Shin, Jeong-Ho Bang | 2009-10-13 |
| 7408339 | Test system of semiconductor device having a handler remote control and method of operating the same | Ae-Yong Chung, Eun-Seok Lee, Jeong-Ho Bang, Kyeong-Seon Shin, Dae-Gab Chi | 2008-08-05 |
| 7378864 | Test apparatus having multiple test sites at one handler and its test method | Ae-Yong Chung, Kyeong-Seon Shin, Jeong-Ho Bang | 2008-05-27 |
| 7230417 | Test system of semiconductor device having a handler remote control and method of operating the same | Ae-Yong Chung, Eun-Seok Lee, Jeong-Ho Bang, Kyeong-Seon Shin, Dae-Gab Chi | 2007-06-12 |
| 6960908 | Method for electrical testing of semiconductor package that detects socket defects in real time | Ae-Yong Chung, Jeong-Ho Bang, Kyeong-Seon Shin, Dae-Gab Chi | 2005-11-01 |
| 6922050 | Method for testing a remnant batch of semiconductor devices | Ae-Yong Chung, Jeong-Ho Bang, Kyeong-Seon Shin, Dae-Gab Chi | 2005-07-26 |
| 6903567 | Test apparatus having multiple test sites at one handler and its test method | Ae-Yong Chung, Kyeong-Seon Shin, Jeong-Ho Bang | 2005-06-07 |
| 6857090 | System and method for automatically analyzing and managing loss factors in test process of semiconductor integrated circuit devices | Kyu-Sung Lee, Ae-Yong Chung | 2005-02-15 |