Issued Patents All Time
Showing 1–10 of 10 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7689876 | Real-time optimized testing of semiconductor device | Hwa-cheol Lee, Se-rae Cho, Kyeong-Seon Shin | 2010-03-30 |
| 7633288 | Method of testing semiconductor devices and handler used for testing semiconductor devices | Eun-Seok Lee, Ki-Sang Kang, Kyeong-Seon Shin | 2009-12-15 |
| 7602172 | Test apparatus having multiple head boards at one handler and its test method | Sung-Ok Kim, Kyeong-Seon Shin, Jeong-Ho Bang | 2009-10-13 |
| 7408339 | Test system of semiconductor device having a handler remote control and method of operating the same | Eun-Seok Lee, Jeong-Ho Bang, Kyeong-Seon Shin, Dae-Gab Chi, Sung-Ok Kim | 2008-08-05 |
| 7378864 | Test apparatus having multiple test sites at one handler and its test method | Sung-Ok Kim, Kyeong-Seon Shin, Jeong-Ho Bang | 2008-05-27 |
| 7230417 | Test system of semiconductor device having a handler remote control and method of operating the same | Eun-Seok Lee, Jeong-Ho Bang, Kyeong-Seon Shin, Dae-Gab Chi, Sung-Ok Kim | 2007-06-12 |
| 6960908 | Method for electrical testing of semiconductor package that detects socket defects in real time | Sung-Ok Kim, Jeong-Ho Bang, Kyeong-Seon Shin, Dae-Gab Chi | 2005-11-01 |
| 6922050 | Method for testing a remnant batch of semiconductor devices | Sung-Ok Kim, Jeong-Ho Bang, Kyeong-Seon Shin, Dae-Gab Chi | 2005-07-26 |
| 6903567 | Test apparatus having multiple test sites at one handler and its test method | Sung-Ok Kim, Kyeong-Seon Shin, Jeong-Ho Bang | 2005-06-07 |
| 6857090 | System and method for automatically analyzing and managing loss factors in test process of semiconductor integrated circuit devices | Kyu-Sung Lee, Sung-Ok Kim | 2005-02-15 |