Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9261555 | Methods of measuring and controlling inner temperature of a chamber included in a test handler | Sang-Kyu Yoon, Sang Joon Ryu, Yong-Hwan Cho | 2016-02-16 |
| 7689876 | Real-time optimized testing of semiconductor device | Ae-Yong Chung, Se-rae Cho, Kyeong-Seon Shin | 2010-03-30 |