Issued Patents All Time
Showing 1–13 of 13 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7886206 | Semiconductor memory test device and method thereof | Je Young Park | 2011-02-08 |
| 7838790 | Multifunctional handler system for electrical testing of semiconductor devices | Seong-goo Kang, Jun Ho Lee, Hyun-Seop Shim, Do-young Kam, Jae Il Lee +1 more | 2010-11-23 |
| 7633288 | Method of testing semiconductor devices and handler used for testing semiconductor devices | Ae-Yong Chung, Eun-Seok Lee, Kyeong-Seon Shin | 2009-12-15 |
| 7554349 | Handlers for testing semiconductor devices that are capable of maintaining stable temperature in test environments | Seong-goo Kang, Jun Ho Lee, Hyun-Seop Shim, Do-young Kam, Jae Il Lee +1 more | 2009-06-30 |
| 7533310 | Semiconductor memory test device and method thereof | Je Young Park | 2009-05-12 |
| 7153087 | Centering mechanism, centering unit, semiconductor manufacturing apparatus, and centering method | Shuji Akiyama, Hiroki Hosaka | 2006-12-26 |
| 7103493 | Memory testing apparatus and method | Tsutomu Akiyama, Je Young Park | 2006-09-05 |
| 6972612 | Semiconductor device with malfunction control circuit and controlling method thereof | Sang-Seok Kang, Kyeong-Seon Shin | 2005-12-06 |
| 6642729 | Probe card for tester head | Sung-Mo Kang | 2003-11-04 |
| 6625766 | Tester of semiconductor memory device and test method thereof | Se-Jang Oh | 2003-09-23 |
| 6507801 | Semiconductor device testing system | Se-Jang Oh, Jeong-Ho Bang | 2003-01-14 |
| 6445172 | Wafer probing system and method of calibrating wafer probing needle using the same | Seok-Ho Park, Se-Jang Oh | 2002-09-03 |
| 6288955 | Methods and systems for testing integrated circuit memory devices by overlappiing test result loading and test result analysis | Kazuhiro Shibano | 2001-09-11 |