HS

Hyun-Seop Shim

Samsung: 11 patents #12,136 of 75,807Top 20%
UN Unknown: 1 patents #29,356 of 83,584Top 40%
Overall (All Time): #352,130 of 4,157,543Top 9%
14
Patents All Time

Issued Patents All Time

Showing 1–14 of 14 patents

Patent #TitleCo-InventorsDate
8632205 LED lighting module using AC power 2014-01-21
8545721 UV coating composition for LED color conversion 2013-10-01
8366008 Radio frequency identification tag, and method of manufacturing the same Woon Chun Kim, Woon Bong Joh, Jae Suk Sung, Soon Gyu Yim 2013-02-05
8310771 LED light converting resin composition and LED member using the same 2012-11-13
7838790 Multifunctional handler system for electrical testing of semiconductor devices Seong-goo Kang, Jun Ho Lee, Ki-Sang Kang, Do-young Kam, Jae Il Lee +1 more 2010-11-23
7554349 Handlers for testing semiconductor devices that are capable of maintaining stable temperature in test environments Seong-goo Kang, Jun Ho Lee, Ki-Sang Kang, Do-young Kam, Jae Il Lee +1 more 2009-06-30
7438563 Connector for testing a semiconductor package Young Bae Chung, Jeong-Ho Bang, Jae Il Lee, Hyun-Kyo Seo, Young-Soo An +1 more 2008-10-21
7327154 Multichip package test Young-Gu Shin, Kyoung-Il Heo, Hyoung-Young Lee, Hyuk Kwon, Ki-Bong Ju +1 more 2008-02-05
7227351 Apparatus and method for performing parallel test on integrated circuit devices Woo-Il Kim, Hyoung-Young Lee, Young-Ki Kwak, Jeong-Ho Bang, Ki-Bong Ju 2007-06-05
7084655 Burn-in test apparatus for BGA packages using forced heat exhaust Byung-Jun Min, Woo Jin Kim, Jeong-Ho Bang, Hyun-Geun Iy, Jae Il Lee 2006-08-01
7017428 Test kit for semiconductor package and method for testing semiconductor package using the same Byoung-jun Min, Jeong-Ho Bang, Hyo-geun Chae 2006-03-28
6943577 Multichip package test Young-Gu Shin, Kyoung-Il Heo, Hyoung-Young Lee, Hyuk Kwon, Ki-Bong Ju +1 more 2005-09-13
6201746 Test method for high speed memory devices in which limit conditions for the clock are defined Ja-Hyun Koo, Jong-Bok Tcho, Jeong-Ho Bang 2001-03-13
5959915 Test method of integrated circuit devices by using a dual edge clock technique Hyuk Sang Kwon, Dong Wook Kim, Keun-won Cho 1999-09-28