Issued Patents All Time
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7327154 | Multichip package test | Young-Gu Shin, Kyoung-Il Heo, Hyoung-Young Lee, Hyuk Kwon, Jeong-Ho Bang +1 more | 2008-02-05 |
| 7227351 | Apparatus and method for performing parallel test on integrated circuit devices | Woo-Il Kim, Hyun-Seop Shim, Hyoung-Young Lee, Young-Ki Kwak, Jeong-Ho Bang | 2007-06-05 |
| 6943577 | Multichip package test | Young-Gu Shin, Kyoung-Il Heo, Hyoung-Young Lee, Hyuk Kwon, Jeong-Ho Bang +1 more | 2005-09-13 |
| 6199185 | Test method for high speed semiconductor devices using a clock modulation technique | Jae Bun Ryu, Il Sik Chi, Heui Han | 2001-03-06 |