Issued Patents All Time
Showing 1–5 of 5 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9285415 | Built-off test device and test system including the same | Hyuk-Joon Kwon, Sang-Go Han | 2016-03-15 |
| 8604813 | Built-off test device and test system including the same | Hyuk Kwon, Sang-Do Han | 2013-12-10 |
| 7327154 | Multichip package test | Young-Gu Shin, Kyoung-Il Heo, Hyuk Kwon, Ki-Bong Ju, Jeong-Ho Bang +1 more | 2008-02-05 |
| 7227351 | Apparatus and method for performing parallel test on integrated circuit devices | Woo-Il Kim, Hyun-Seop Shim, Young-Ki Kwak, Jeong-Ho Bang, Ki-Bong Ju | 2007-06-05 |
| 6943577 | Multichip package test | Young-Gu Shin, Kyoung-Il Heo, Hyuk Kwon, Ki-Bong Ju, Jeong-Ho Bang +1 more | 2005-09-13 |