Issued Patents All Time
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 5959915 | Test method of integrated circuit devices by using a dual edge clock technique | Hyuk Sang Kwon, Dong Wook Kim, Hyun-Seop Shim | 1999-09-28 |
KC
Keun-won Cho
Overall (All Time): #3,661,956 of 4,157,543Top 90%
1
Patents All Time