Issued Patents All Time
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7168017 | Memory devices with selectively enabled output circuits for test mode and method of testing the same | Sung-Ryul Kim, Woo-Seop Jeong | 2007-01-23 |
| 6842031 | Method of electrically testing semiconductor devices | Gil-Young Koh, Jeong-Ho Bang | 2005-01-11 |
| 6201746 | Test method for high speed memory devices in which limit conditions for the clock are defined | Ja-Hyun Koo, Hyun-Seop Shim, Jeong-Ho Bang | 2001-03-13 |