| 8866810 |
Mobile terminal and display controlling method thereof |
Eun Woo CHO, Hyun Bin Shin, Joon Hun Shin |
2014-10-21 |
| 8547766 |
Area-efficient data line layouts to suppress the degradation of electrical characteristics |
Jong-Hak Won, Hyang-Ja Yang, Choong-Sun Shin, Hak-Soo Yu, Jung-Hyeon Kim |
2013-10-01 |
| 8347216 |
Mobile terminal and video sharing method thereof |
Hyun Bin Shin, Eun Woo CHO |
2013-01-01 |
| 8139949 |
Electrical signal transmission module, method of transmitting electric signals and electrical inspection apparatus having the same |
Sang Hoon Lee, Ho-Jeong Choi, Se-Jang Oh, Gyu-Yeol Kim |
2012-03-20 |
| 8130577 |
Semiconductor memory device |
Jong-Hak Won, Jung-Hyeon Kim |
2012-03-06 |
| 8026733 |
Interface structure of wafer test equipment |
Sang Hoon Lee, Chang-Woo Ko, Se-Jang Oh |
2011-09-27 |
| 7884628 |
Interposer and probe card having the same |
Sang Hoon Lee, Se-Jang Oh |
2011-02-08 |
| 7880490 |
Wireless interface probe card for high speed one-shot wafer test and semiconductor testing apparatus having the same |
Sang Hoon Lee, Kwang-Yong Lee, Se-Jang Oh |
2011-02-01 |
| 7786721 |
Multilayer type test board assembly for high-precision inspection |
Min Gu Kim, Ho-Jeong Choi, Jung-Hyeon Kim |
2010-08-31 |
| 7659735 |
Probe card capable of multi-probing |
Min Gu Kim, Ho-Jeong Choi |
2010-02-09 |
| 7538566 |
Electrical test system including coaxial cables |
Se-Jang Oh, Jung-Hyun Nam |
2009-05-26 |
| 7438563 |
Connector for testing a semiconductor package |
Young Bae Chung, Hyun-Seop Shim, Jeong-Ho Bang, Jae Il Lee, Hyun-Kyo Seo +1 more |
2008-10-21 |
| 6489790 |
Socket including pressure conductive rubber and mesh for testing of ball grid array package |
Jae Il Lee, Hyo-geun Chae, Jeong-Ho Bang |
2002-12-03 |
| 6396294 |
Socket pin and socket for electrical testing of semiconductor packages |
Young Moon LEE, Jae Il Lee, Hyo-geun Chae |
2002-05-28 |
