Issued Patents All Time
Showing 1–11 of 11 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8674718 | Built off testing apparatus | Eun-Jo Byun, Cheol-Jong Woo | 2014-03-18 |
| 8606102 | Test interface device, test system and optical interface memory device | Sang Hoon Lee, Eun-Jo Byun, Cheol-Jong Woo | 2013-12-10 |
| 8139949 | Electrical signal transmission module, method of transmitting electric signals and electrical inspection apparatus having the same | Sang Hoon Lee, Ho-Jeong Choi, Young-Soo An, Gyu-Yeol Kim | 2012-03-20 |
| 8026733 | Interface structure of wafer test equipment | Sang Hoon Lee, Chang-Woo Ko, Young-Soo An | 2011-09-27 |
| 7973550 | Semiconductor device test apparatus including interface unit and method of testing semiconductor device using the same | Eun-Jo Byun, Sang Hoon Lee, Cheol-Jong Woo | 2011-07-05 |
| 7884628 | Interposer and probe card having the same | Young-Soo An, Sang Hoon Lee | 2011-02-08 |
| 7880490 | Wireless interface probe card for high speed one-shot wafer test and semiconductor testing apparatus having the same | Sang Hoon Lee, Kwang-Yong Lee, Young-Soo An | 2011-02-01 |
| 7538566 | Electrical test system including coaxial cables | Young-Soo An, Jung-Hyun Nam | 2009-05-26 |
| 6625766 | Tester of semiconductor memory device and test method thereof | Ki-Sang Kang | 2003-09-23 |
| 6507801 | Semiconductor device testing system | Ki-Sang Kang, Jeong-Ho Bang | 2003-01-14 |
| 6445172 | Wafer probing system and method of calibrating wafer probing needle using the same | Seok-Ho Park, Ki-Sang Kang | 2002-09-03 |