Issued Patents All Time
Showing 26–46 of 46 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10630289 | On-die-termination circuit and control method for of the same | Shen-Kuo Huang, Chih-Wei Chang, Gerchih Chou | 2020-04-21 |
| 10522204 | Memory signal phase difference calibration circuit and method | Fu-Chin Tsai, Shih-Han Lin, Chih-Wei Chang, Gerchih Chou | 2019-12-31 |
| 10269443 | Memory device and test method of the same | Chih-Wei Chang, Shen-Kuo Huang | 2019-04-23 |
| 10056124 | Memory control device for repeating data during a preamble signal or a postamble signal and memory control method | Chih-Wei Chang, Shen-Kuo Huang, Gerchih Chou | 2018-08-21 |
| 9653404 | Overlay target for optically measuring overlay alignment of layers formed on semiconductor wafer | Yi-Jing Wang, En-Chiuan Liou, Mei-Chen Chen, Han-Lin Zeng, Chia-Hung Lin | 2017-05-16 |
| 9570130 | Memory system and memory physical layer interface circuit | Chih-Wei Chang, Gerchih Chou, Fu-Chin Tsai, Shih-Chang Chen | 2017-02-14 |
| 9494873 | Asymmetry compensation method used in lithography overlay process | En-Chiuan Liou, Teng-Chin Kuo, Yuan-Chi Pai | 2016-11-15 |
| 9482964 | Overlap mark set and method for selecting recipe of measuring overlap error | En-Chiuan Liou, Chia-Chang Hsu, Yi-Ting Chen, Teng-Chin Kuo | 2016-11-01 |
| 9448471 | Photo-mask and method of manufacturing semiconductor structures by using the same | En-Chiuan Liou, Yu-Cheng Tung, Teng-Chin Kuo, Yuan-Chi Pai | 2016-09-20 |
| 9400435 | Method of correcting overlay error | En-Chiuan Liou, Chia-Chang Hsu, Teng-Chin Kuo, Chia-Hung Wang, Tuan-Yen Yu +1 more | 2016-07-26 |
| 9355708 | Memory control circuit for adjusting reference voltage and associated memory control method | Chih-Wei Chang, Shen-Kuo Huang | 2016-05-31 |
| 9147601 | Method of forming via hole | Cheng-Han Wu | 2015-09-29 |
| 9136140 | Patterning method | Wen-Liang Huang, Chia-Hung Lin | 2015-09-15 |
| 9135980 | Memory control circuit and method of controlling data reading process of memory module | Chih-Wei Chang, Shen-Kuo Huang | 2015-09-15 |
| 9007571 | Measurement method of overlay mark | Wei-Jhe Tzai, Kuei-Chun Hung, Chien-Hao Chen, Chia-Ching Lin | 2015-04-14 |
| 8916051 | Method of forming via hole | Cheng-Han Wu | 2014-12-23 |
| 8729716 | Alignment accuracy mark | Kai-Lin Chuang, Wen-Liang Huang, Chia-Hung Lin | 2014-05-20 |
| 8564143 | Overlay mark for multiple pre-layers and currently layer | Yi-Ting Chen, Chien-Hao Chen, Yuan-Chi Pai | 2013-10-22 |
| 8476004 | Method for forming photoresist patterns | Yong Huang, Cheng-Han Wu, Yuan-Chi Pai, Hung-Yi Wu | 2013-07-02 |
| 7633601 | Method and related operation system for immersion lithography | Yong Huang, Benjamin Szu-Min Lin, Huan-Ting Tseng, Bo-Jou Lu | 2009-12-15 |
| 7476472 | Method for designing photomask | Ming-Feng Shieh, Benjamin Szu-Min Lin, Jian-Shin Liou | 2009-01-13 |