Issued Patents All Time
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date | Approx Value ⓘ |
|---|---|---|---|---|
| 9653404 | Overlay target for optically measuring overlay alignment of layers formed on semiconductor wafer | Yi-Jing Wang, En-Chiuan Liou, Han-Lin Zeng, Chia-Hung Lin, Chun-Chi Yu | 2017-05-16 | $134,000 |
| 9530646 | Method of forming a semiconductor structure | Li-Wei Feng, Shih-Hung Tsai, Chao-Hung Lin, Hon-Huei Liu, An-Chi Liu +8 more | 2016-12-27 | $82,000 |
| 9373505 | Mark segmentation method and method for manufacturing a semiconductor structure applying the same | En-Chiuan Liou, Yu-Ying Huang, Jen-Hsiu Li, Ya-Ling Chen, Yi-Jing Wang +1 more | 2016-06-21 | $399,000 |