Issued Patents All Time
Showing 1–25 of 40 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12428879 | Security lock | Chien-Hung Wu | 2025-09-30 |
| 12385290 | Locking method for an electronic device and electronic device locking apparatus | Chia-Ming Wu, Kuo-Kuang Pan | 2025-08-12 |
| 12276137 | Stepless adjustable electronic device locking apparatus | Chia-Ming Wu, Kuo-Kuang Pan | 2025-04-15 |
| 11591822 | Multi-key lock core | — | 2023-02-28 |
| D899219 | Lock box | Chang-Chiang Yu, Chien-Hung Wu | 2020-10-20 |
| 10794092 | Lock box | Chang-Chiang Yu, Chien-Hung Wu | 2020-10-06 |
| 10707092 | Manufacturing method for semiconductor pattern | En-Chiuan Liou, Chien-Hao Chen, Jhao-Hao Lee, Sho-Shen Lee, Chih-Yu Chiang | 2020-07-07 |
| 10707213 | Method of forming layout of semiconductor device | En-Chiuan Liou, Chien-Hao Chen, Sho-Shen Lee, Yi-Ting Chen, Jhao-Hao Lee | 2020-07-07 |
| 10692785 | Semiconductor pattern for monitoring overlay and critical dimension at post-etching stage and metrology method of the same | Chien-Hao Chen, Chien-Wei Huang, Sho-Shen Lee | 2020-06-23 |
| 10535610 | Semiconductor structure | Feng-Yi Chang, Fu-Che Lee, Yi-Wang Zhan, Chia-Liang Liao, Yu-Cheng Tung +1 more | 2020-01-14 |
| 10513871 | Knob lock and lock box having the same | Chih-Lun Wang | 2019-12-24 |
| 10079185 | Semiconductor pattern for monitoring overlay and critical dimension at post-etching stage and metrology method of the same | Chien-Hao Chen, Chien-Wei Huang, Sho-Shen Lee | 2018-09-18 |
| 10017965 | Chain lock | — | 2018-07-10 |
| 9981030 | Glycan conjugates and use thereof | Chi-Huey Wong, Chung-Yi Wu, Shiou-Ting Li | 2018-05-29 |
| 9964866 | Method of forming integrated circuit | Che-Yi Lin, En-Chiuan Liou, Chia-Hsun Tseng, Yi-Ting Chen, Yi-Jing Wang | 2018-05-08 |
| 9764786 | Lock | Chung-Yi Huang | 2017-09-19 |
| 9752354 | Chain lock | — | 2017-09-05 |
| 9753373 | Lithography system and semiconductor processing process | En-Chiuan Liou | 2017-09-05 |
| 9490217 | Overlay marks and semiconductor process using the overlay marks | Chia-Ching Lin, En-Chiuan Liou, Sho-Shen Lee | 2016-11-08 |
| 9400435 | Method of correcting overlay error | En-Chiuan Liou, Chia-Chang Hsu, Teng-Chin Kuo, Tuan-Yen Yu, Yuan-Chi Pai +1 more | 2016-07-26 |
| 9078321 | Light emitting system with light emitting power stabilization | Tai-Ping Sun, Jia Li | 2015-07-07 |
| 9030112 | Illumination system, and driving device and signal transmitter device thereof | Tai-Ping Sun, Jia-Yu Chen | 2015-05-12 |
| 8723445 | Light power compensation device, light power compensation circuit, and detecting module | Tai-Ping Sun, Huei-Jyun Lin | 2014-05-13 |
| 8704458 | Light emitting system capable of color temperature stabilization | Tai-Ping Sun | 2014-04-22 |
| 8669719 | Light-emitting system having a luminous flux control device | Tai-Ping Sun, Li-Wen Mao | 2014-03-11 |