Issued Patents All Time
Showing 1–14 of 14 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10763264 | Method for forming dynamic random access memory structure | En-Chiuan Liou, Yu-Cheng Tung, Chih-Wei Yang | 2020-09-01 |
| 10707092 | Manufacturing method for semiconductor pattern | Chia-Hung Wang, En-Chiuan Liou, Chien-Hao Chen, Jhao-Hao Lee, Chih-Yu Chiang | 2020-07-07 |
| 10707213 | Method of forming layout of semiconductor device | Chia-Hung Wang, En-Chiuan Liou, Chien-Hao Chen, Yi-Ting Chen, Jhao-Hao Lee | 2020-07-07 |
| 10692785 | Semiconductor pattern for monitoring overlay and critical dimension at post-etching stage and metrology method of the same | Chien-Hao Chen, Chien-Wei Huang, Chia-Hung Wang | 2020-06-23 |
| 10529667 | Method of forming overlay mark structure | Zheng-Feng Chen, En-Chiuan Liou, Hsiao-Lin Hsu, Yi-Ting Chen, Lu-Wei Kuo | 2020-01-07 |
| 10453849 | Dynamic random access memory structure and method for forming the same | En-Chiuan Liou, Yu-Cheng Tung, Chih-Wei Yang | 2019-10-22 |
| 10373915 | Method for monitoring semiconductor process | Hsiao-Lin Hsu, En-Chiuan Liou, Yi-Ting Chen | 2019-08-06 |
| 10276395 | Method for manufacturing semiconductor device | Chien-Hao Chen, Feng-Lun Wu, Chung-Ping Hsia | 2019-04-30 |
| 10177094 | Measurement mark and method for monitoring semiconductor process | Hsiao-Lin Hsu, En-Chiuan Liou, Yi-Ting Chen | 2019-01-08 |
| 10079185 | Semiconductor pattern for monitoring overlay and critical dimension at post-etching stage and metrology method of the same | Chien-Hao Chen, Chien-Wei Huang, Chia-Hung Wang | 2018-09-18 |
| 9490217 | Overlay marks and semiconductor process using the overlay marks | Chia-Ching Lin, En-Chiuan Liou, Chia-Hung Wang | 2016-11-08 |
| 9304389 | Photomask and fabrication method thereof | En-Chiuan Liou, Wen-Liang Huang, Chang-Mao Wang, Kai-Lin Chuang | 2016-04-05 |
| 8954919 | Calculation method for generating layout pattern in photomask | En-Chiuan Liou, Wen-Liang Huang, Chang-Mao Wang, Kai-Lin Chuang, Yu-Chin Huang | 2015-02-10 |
| 8524423 | Method of forming assist feature patterns | Yi-Chih Chiang, Yuan-Chi Pai, Yi-Ting Chen, Tuan-Yen Yu | 2013-09-03 |