Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10600692 | Semiconductor device | En-Chiuan Liou | 2020-03-24 |
| 10529667 | Method of forming overlay mark structure | Zheng-Feng Chen, Sho-Shen Lee, En-Chiuan Liou, Yi-Ting Chen, Lu-Wei Kuo | 2020-01-07 |
| 10395999 | Method for monitoring fin removal | Cheng-Hao Yang, En-Chiuan Liou, Tang-Chun Weng, Chia-Ching Lin, Yen-Pu Chen | 2019-08-27 |
| 10373915 | Method for monitoring semiconductor process | En-Chiuan Liou, Yi-Ting Chen, Sho-Shen Lee | 2019-08-06 |
| 10177094 | Measurement mark and method for monitoring semiconductor process | En-Chiuan Liou, Yi-Ting Chen, Sho-Shen Lee | 2019-01-08 |
| 10170369 | Semiconductor device and fabrication method thereof | En-Chiuan Liou | 2019-01-01 |