Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Measurement mark and method for monitoring semiconductor process

Measurement mark and method for monitoring semiconductor process

US Patent 10177094 · Granted Jan 8, 2019

Estimated economic value: $159,000 ⓘ

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Multi-stimulation neurorehabilitation assistant system2025
Photomask structure2025
Method of forming a layout pattern and photomask2025
Photomask structure2025
Generating a plan for routing updates for discovered resources at networks with 2025
Semiconductor structure2025
Detection of abnormal operations in connected vehicles2025
Adaptive network threat detection in distributed automotive execution environmen2025
Antibody-TNF α fusion protein and its preparation and applications2025
Die seal ring structure2025
Driving scenario understanding2024
Protective case for a watch2024