Issued Patents All Time
Showing 1–25 of 25 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11152347 | Cell circuits formed in circuit cells employing offset gate cut areas in a non-active area for routing transistor gate cross-connections | Stanley Seungchul Song, Kern Rim, John Jianhong Zhu | 2021-10-19 |
| 10763364 | Circuits having a diffusion break with avoided or reduced adjacent semiconductor channel strain relaxation, and related methods | Stanley Seungchul Song, Kern Rim, Peijie Feng | 2020-09-01 |
| 10700204 | Circuits having a diffusion break with avoided or reduced adjacent semiconductor channel strain relaxation, and related methods | Stanley Seungchul Song, Kern Rim, Peijie Feng | 2020-06-30 |
| 10559501 | Self-aligned quadruple patterning process for Fin pitch below 20nm | Stanley Seungchul Song, Jeffrey Junhao Xu, Kern Rim, Choh Fei Yeap | 2020-02-11 |
| 10497702 | Metal-oxide semiconductor (MOS) standard cells employing electrically coupled source regions and supply rails to relax source-drain tip-to-tip spacing between adjacent MOS standard cells | John Jianhong Zhu, Jeffrey Junhao Xu | 2019-12-03 |
| 10181403 | Layout effect mitigation in FinFET | Yanxiang Liu, Jun Yuan, Kern Rim | 2019-01-15 |
| 10090244 | Standard cell circuits employing high aspect ratio voltage rails for reduced resistance | Jeffrey Junhao Xu, Mustafa Badaroglu, Periannan Chidambaram | 2018-10-02 |
| 10079293 | Semiconductor device having a gap defined therein | Jeffrey Junhao Xu, Kern Rim, John Jianhong Zhu, Stanley Seungchul Song, Mustafa Badaroglu +2 more | 2018-09-18 |
| 10043796 | Vertically stacked nanowire field effect transistors | Vladimir Machkaoutsan, Stanley Seungchul Song, Mustafa Badaroglu, John Jianhong Zhu, Junjing Bao +3 more | 2018-08-07 |
| 10032678 | Nanowire channel structures of continuously stacked nanowires for complementary metal oxide semiconductor (CMOS) devices | Jeffrey Junhao Xu, Stanley Seungchul Song, Vladimir Machkaoutsan, Mustafa Badaroglu, Choh Fei Yeap | 2018-07-24 |
| 9997360 | Method for mitigating layout effect in FINFET | Yanxiang Liu, Jun Yuan, Kern Rim | 2018-06-12 |
| 9985014 | Minimum track standard cell circuits for reduced area | Jeffrey Junhao Xu, Mustafa Badaroglu | 2018-05-29 |
| 9953979 | Contact wrap around structure | Jeffrey Junhao Xu, Stanley Seungchul Song, Vladimir Machkaoutsan, Mustafa Badaroglu, Junjing Bao +2 more | 2018-04-24 |
| 9871121 | Semiconductor device having a gap defined therein | Jeffrey Junhao Xu, Kern Rim, John Jianhong Zhu, Stanley Seungchul Song, Mustafa Badaroglu +2 more | 2018-01-16 |
| 9859210 | Integrated circuits having reduced dimensions between components | Stanley Seungchul Song, Choh Fei Yeap | 2018-01-02 |
| 9799560 | Self-aligned structure | Stanley Seungchul Song, Jeffrey Junhao Xu, Kern Rim, John Jianhong Zhu, Junjing Bao +4 more | 2017-10-24 |
| 9653399 | Middle-of-line integration methods and semiconductor devices | John Jianhong Zhu, Jeffrey Junhao Xu, Stanley Seungchul Song, Kern Rim | 2017-05-16 |
| 9620454 | Middle-of-line (MOL) manufactured integrated circuits (ICs) employing local interconnects of metal lines using an elongated via, and related methods | John Jianhong Zhu, Kern Rim, Stanley Seungchul Song, Jeffrey Junhao Xu | 2017-04-11 |
| 9502283 | Electron-beam (E-beam) based semiconductor device features | Stanley Seungchul Song, Jeffrey Junhao Xu, Choh Fei Yeap | 2016-11-22 |
| 9397007 | Method for manufacturing semiconductor structure through forming an additional layer inside opening of a photoresist layer | Huicai Zhong, Qingqing Liang, Chao Zhao | 2016-07-19 |
| 9263279 | Combining cut mask lithography and conventional lithography to achieve sub-threshold pattern features | John Jianhong Zhu, Zhongze Wang | 2016-02-16 |
| 9245971 | Semiconductor device having high mobility channel | Bin Yang, P R Chidambaram, John Jianhong Zhu, Jihong Choi, Ravi M. Todi +4 more | 2016-01-26 |
| 8669160 | Method for manufacturing a semiconductor device | Haizhou Yin, Zhijiong Luo, Huilong Zhu | 2014-03-11 |
| 8420492 | MOS transistor and method for forming the same | Huicai Zhong, Qingqing Liang, Chao Zhao | 2013-04-16 |
| 7989804 | Test pattern structure | Chih-Ping Lee, Rui Cheng, Xing Zhang, Xu Jason Ma, Xiao Han +3 more | 2011-08-02 |