Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
SL

Stephan Lassig — 7 Patents

Lam Research: 3 patents #821 of 2,128Top 40%
PSPeak Systems: 2 patents #2 of 9Top 25%
NSNovellus Systems: 1 patents #479 of 780Top 65%
IBM: 1 patents #44,878 of 70,183Top 65%
Danville, CA: #293 of 1,210 inventorsTop 25%
California: #83,669 of 386,348 inventorsTop 25%
Overall (All Time): #680,018 of 4,157,543Top 20%
7 Patents All Time
Stephan Lassig has been granted 7 US patents while listed as an inventor at Lam Research. The first was granted in 1988 and the most recent in January 2018. Stephan Lassig ranks #680,018 of 4,157,543 US inventors in our database (top 16.4%). Patent records list Stephan Lassig in Danville, CA, US.

Patents per Year

Patents granted per year, 1988 to 2018Bar chart with a peak of 1 patents in 1988.peak 11988: 1 patents19881990: 1 patents19901991: 1 patents19911996: 1 patents19962005: 1 patents20052016: 1 patents20162018: 1 patents2018

Issued Patents All Time

Showing 1–7 of 7 patents

Patent #TitleCo-InventorsDateApprox Value ⓘ
9865472 Fabrication of a silicon structure and deep silicon etch with profile control Robert Chebi, Frank Y. Lin, Jaroslaw W. Winniczek, Wan-Lin Chen, Erin Moore +3 more 2018-01-09 $33,483,000
9330926 Fabrication of a silicon structure and deep silicon etch with profile control Robert Chebi, Frank Y. Lin, Jaroslaw W. Winniczek, Wan-Lin Chen, Erin McDonnell +3 more 2016-05-03 $20,231,000
6875699 Method for patterning multilevel interconnects S. M. Reza Sadjadi, Vinay Pohray, Si Yi Li, Thomas W. Mountsier, Chiu Chi 2005-04-05
5548470 Characterization, modeling, and design of an electrostatic chuck with improved wafer temperature uniformity Anwar Husain, David E. Kotecki, Kurt A. Olson, Anthony J. Ricci 1996-08-20 $9,974,000
4984902 Apparatus and method for compensating for errors in temperature measurement of semiconductor wafers during rapid thermal processing John L. Crowley, Ahmad Kermani, Noel H. Johnson, Gary R. Rickords 1991-01-15
4969748 Apparatus and method for compensating for errors in temperature measurement of semiconductor wafers during rapid thermal processing John L. Crowley, Ahmad Kermani, Noel H. Johnson, Gary R. Rickords 1990-11-13
4755654 Semiconductor wafer heating chamber John L. Crowley, Thomas J. DeBolski, Ahmad Kermani 1988-07-05