Issued Patents All Time
Showing 76–100 of 121 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7554662 | Spatial filter means comprising an aperture with a non-unity aspect ratio in a system for investigating samples with electromagnetic radiation | Ping He, Blaine D. Johs, Craig M. Herzinger | 2009-06-30 |
| 7535566 | Beam chromatic shifting and directing means | Blaine D. Johs, Galen L. Pfeiffer, Jeffrey S. Hale, Christopher A. Goeden, Brian D. Guenther +1 more | 2009-05-19 |
| 7522279 | System for and method of investigating the exact same point on a sample substrate with multiple wavelengths | Blaine D. Johs, Craig M. Herzinger, Ping He, Christopher A. Goeden, John A. Woollam +1 more | 2009-04-21 |
| 7518725 | Temperature controlled lens | — | 2009-04-14 |
| 7508510 | System for and method of investigating the exact same point on a sample substrate with multiple wavelengths | Galen L. Pfeiffer, Blaine D. Johs, Craig M. Herzinger, Christopher A. Goeden, Ping He +2 more | 2009-03-24 |
| 7505134 | Automated ellipsometer and the like systems | Blaine D. Johs, Ping He, Christopher A. Goeden, John A. Woollam, James D. Welch | 2009-03-17 |
| 7492455 | Discrete polarization state spectroscopic ellipsometer system and method of use | Blaine D. Johs, Ping He, Jeffrey S. Hale | 2009-02-17 |
| 7489400 | System and method of applying xenon arc-lamps to provide 193 nm wavelengths | Ping He, James D. Welch | 2009-02-10 |
| 7477388 | Sample masking in ellipsometer and the like systems including detection of substrate backside reflections | James D. Welch, Corey L. Bungay, John A. Woollam | 2009-01-13 |
| 7468794 | Rotating compensator ellipsometer system with spatial filter equivalent | Blaine D. Johs, Craig M. Herzinger, Ping He | 2008-12-23 |
| 7426030 | Reduced gas flow purging system in reflectometer, ellipsometer, polarimeter and the like systems | James D. Welch | 2008-09-16 |
| 7385697 | Sample analysis methodology utilizing electromagnetic radiation | John A. Woollam, Corey L. Bungay, Thomas E. Tiwald, Ronald A. Synowicki, Gregory K. Pribil +3 more | 2008-06-10 |
| 7385698 | System and method of selectively monitoring sample front and backside reflections in ellipsometer and the like systems | James D. Welch, John A. Woollam | 2008-06-10 |
| 7345762 | Control of beam spot size in ellipsometer and the like systems | Blaine D. Johs, John A. Woollam, Duane E. Meyer, James D. Welch | 2008-03-18 |
| 7336361 | Spectroscopic ellipsometer and polarimeter systems | Blaine D. Johs, Jeffrey S. Hale, Craig M. Herzinger, Steven E. Green, Ping He +1 more | 2008-02-26 |
| 7333198 | Sample orientation system and method | — | 2008-02-19 |
| 7327456 | Spectrophotometer, ellipsometer, polarimeter and the like systems | John A. Woollam, Steven E. Green, Ping He, Blaine D. Johs, Craig M. Herzinger +3 more | 2008-02-05 |
| 7317530 | Combined spatial filter and relay systems | Ping He | 2008-01-08 |
| 7317529 | Aspects of producing, directing, conditioning, impinging and detecting spectroscopic electromagnetic radiation from small spots on samples | Ping He, Blaine D. Johs, Galen L. Pfeiffer, James D. Welch, John A. Woollam | 2008-01-08 |
| 7307724 | Method of reducing the effect of noise in determining the value of a dependent variable | Blaine D. Johs | 2007-12-11 |
| 7304792 | System for sequentially providing aberation corrected electromagnetic radiation to a spot on a sample at multiple angles of incidence | John A. Woollam | 2007-12-04 |
| 7304737 | Rotating or rotatable compensator system providing aberation corrected electromagnetic raadiation to a spot on a sample at multiple angles of a incidence | Blaine D. Johs, Jeffrey S. Hale, Craig M. Herzinger, Steven E. Green, Ping He +1 more | 2007-12-04 |
| 7301631 | Control of uncertain angle of incidence of beam from Arc lamp | Blaine D. Johs, Ping He, Galen L. Pfeiffer, Steven E. Green, Christopher A. Goeden | 2007-11-27 |
| 7283234 | Use of ellipsometry and surface plasmon resonance in monitoring thin film deposition or removal from a substrate surface | John A. Woollam, Blaine D. Johs, Thomas E. Tiwald, James D. Welch | 2007-10-16 |
| 7277171 | Flying mobile on-board ellipsometer, polarimeter, reflectometer and the like systems | Blaine D. Johs, Ping He, Christopher A. Goeden, John A. Woollam, James D. Welch | 2007-10-02 |