Issued Patents All Time
Showing 26–50 of 121 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9442016 | Reflective focusing optics | Jeffrey S. Hale, Ping He, Galen L. Pfeiffer | 2016-09-13 |
| 9360369 | System for determining average ellipsometric parameters for planar or non-planar shaped objects, and method of its use | Galen L. Pfeiffer | 2016-06-07 |
| 9347768 | In line ellipsometer system and method of use | Galen L. Pfeiffer, Blaine D. Johs, Brian D. Guenther, Jeffrey S. Hale | 2016-05-24 |
| 9041927 | Terahertz-infrared ellipsometer system, and method of use | Craig M. Herzinger, Mathias M. Schubert, Tino Hofmann, John A. Woollam | 2015-05-26 |
| 8983787 | Method of evaluating data quality | — | 2015-03-17 |
| 8953030 | System for viewing samples that are undergoing ellipsometric investigation in real time | Galen L. Pfeiffer | 2015-02-10 |
| 8934096 | Terahertz-infrared ellipsometer system, and method of use | Craig M. Herzinger, Mathias M. Schubert, Tino Hofmann, John A. Woollam | 2015-01-13 |
| 8749785 | Operation of an electromagnetic radiation focusing element | — | 2014-06-10 |
| 8749782 | DLP base small spot investigation system | Galen L. Pfeiffer | 2014-06-10 |
| 8705032 | Terahertz-infrared ellipsometer system, and method of use | Craig M. Herzinger, Mathias M. Schubert, Tino Hofmann, John A. Woollam | 2014-04-22 |
| 8638437 | System and method of aligning a sample | Blaine D. Johs | 2014-01-28 |
| 8600703 | Method of evaluating data quality | — | 2013-12-03 |
| 8587781 | View-finder in ellipsometer or the like systems | Ping He | 2013-11-19 |
| 8570513 | Ellipsometric investigation and analysis of textured samples | James N. Hilfiker, Jianing Sun, Ping He | 2013-10-29 |
| 8493565 | Small volume cell | Galen L. Pfeiffer, Thomas E. Tiwald | 2013-07-23 |
| 8488119 | Terahertz-infrared ellipsometer system, and method of use | Craig M. Herzinger, Mathias M. Schubert, Tino Hofmann, John A. Woollam | 2013-07-16 |
| 8462341 | Mounting for deviation angle self compensating substantially achromatic retarder | Ping He, Blaine D. Johs, Steven E. Green, Craig M. Herzinger, Duane E. Meyer | 2013-06-11 |
| 8436994 | Fast sample height, AOI and POI alignment in mapping ellipsometer or the like | Jeffrey S. Hale, Ping He, Galen L. Pfeiffer | 2013-05-07 |
| 8416410 | Conjugate ratio adjustable lens system | — | 2013-04-09 |
| 8416408 | Terahertz-infrared ellipsometer system, and method of use | Craig M. Herzinger, Mathias M. Schubert, Tino Hofmann, John A. Woollam | 2013-04-09 |
| 8351036 | System for naturally adjusting the cross-sectional area of a beam of electromagnetic radiation entered to a focusing means | — | 2013-01-08 |
| 8345241 | Application of digital light processor in imaging ellipsometer and the like systems | — | 2013-01-01 |
| 8339602 | View-finder in ellipsometer or the like systems | Ping He | 2012-12-25 |
| 8339603 | Mapping ellipsometers and polarimeters comprising polarization state compensating beam directing means, and method of use | Blaine D. Johs | 2012-12-25 |
| 8253940 | UV-IR range variable angle spectroscopic ellipsometer | Steven E. Green, Gerald T. Cooney | 2012-08-28 |