Issued Patents All Time
Showing 1–25 of 63 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11675208 | Reflectometer, spectrophotometer, ellipsometer and polarimeter system with a super continuum laser source of a beam of electromagnetism, and improved detector system | Stefan Schoeche, Martin M. Liphardt, Ping He, Jeremy A. Van Derslice, Craig M. Herzinger +4 more | 2023-06-13 |
| 10101265 | Birefringence imaging chromatography based on highly ordered 3D nanostructures | Mathias M. Schubert, Tino Hofmann, David S. Hage, Erika Pfaunmiller, Craig M. Herzinger +1 more | 2018-10-16 |
| 10073120 | Integrated vacuum-ultraviolet, mid and near-ultraviolet, visible, near, mid and far infrared and terahertz optical hall effect (OHE) instrument, and method of use | Tino Hofmann, Mathias M. Schubert, Stefan Schoeche, Philipp Kuehne, Craig M. Herzinger +3 more | 2018-09-11 |
| 10048059 | Combined use of oscillating means and ellipsometry to determine uncorrelated effective thickness and optical constants of material deposited at or etched from a working electrode that preferrably comprises non-normal oriented nanofibers | Mathias M. Schubert, Tino Hofmann, Rebecca Y. Lai | 2018-08-14 |
| 10026167 | Method of obtaining micrographs of transparent or semi-transparent specimens using anisotropic contrast | Tino Hofmann, Mathias M. Schubert, Tadas Kasputis, Angela K. Pannier, Craig M. Herzinger | 2018-07-17 |
| 9851294 | Integrated mid-infrared, far infrared and terahertz optical Hall effect (OHE) instrument, and method of use | Tino Hofmann, Mathias M. Schubert, Stefan Schoeche, Sean R. Knight, Craig M. Herzinger +2 more | 2017-12-26 |
| 9041927 | Terahertz-infrared ellipsometer system, and method of use | Craig M. Herzinger, Mathias M. Schubert, Tino Hofmann, Martin M. Liphardt | 2015-05-26 |
| 8934096 | Terahertz-infrared ellipsometer system, and method of use | Craig M. Herzinger, Mathias M. Schubert, Tino Hofmann, Martin M. Liphardt | 2015-01-13 |
| 8705032 | Terahertz-infrared ellipsometer system, and method of use | Craig M. Herzinger, Mathias M. Schubert, Tino Hofmann, Martin M. Liphardt | 2014-04-22 |
| 8488119 | Terahertz-infrared ellipsometer system, and method of use | Craig M. Herzinger, Mathias M. Schubert, Tino Hofmann, Martin M. Liphardt | 2013-07-16 |
| 8416408 | Terahertz-infrared ellipsometer system, and method of use | Craig M. Herzinger, Mathias M. Schubert, Tino Hofmann, Martin M. Liphardt | 2013-04-09 |
| 8169611 | Terahertz-infrared ellipsometer system, and method of use | Craig M. Herzinger, Matias M. Schubert, Tino Hofmann, Martin M. Liphardt | 2012-05-01 |
| 8159672 | Sample investigating system and method of use | Martin M. Liphardt, Thomas E. Tiwald, Blaine D. Johs, Jeffrey S. Hale, Craig M. Herzinger +3 more | 2012-04-17 |
| 7768660 | Non-destructive approach to ellipsometric monitoring of a film coating on the inner surface of a tube shaped sample | Gregory K. Pribil, Martin M. Liphardt, James D. Welch | 2010-08-03 |
| 7746472 | Automated ellipsometer and the like systems | Blaine D. Johs, Ping He, Martin M. Liphardt, Christopher A. Goeden, James D. Welch | 2010-06-29 |
| 7746471 | Flying mobile on-board ellipsometer, polarimeter, reflectometer and the like systems | Blaine D. Johs, Ping He, Martin M. Liphardt, Christopher A. Goeden, James D. Welch | 2010-06-29 |
| 7633625 | Spectroscopic ellipsometer and polarimeter systems | Blaine D. Johs, Craig M. Herzinger, Ping He, Martin M. Liphardt, Galen L. Pfeiffer | 2009-12-15 |
| 7623237 | Sample investigating system | Martin M. Liphardt, Thomas E. Tiwald, Blaine D. Johs, Jeffrey S. Hale, Craig M. Herzinger +3 more | 2009-11-24 |
| 7616319 | Spectroscopic ellipsometer and polarimeter systems | Blaine D. Johs, Craig M. Herzinger, Ping He, Martin M. Liphardt, Galen L. Pfeiffer | 2009-11-10 |
| 7522279 | System for and method of investigating the exact same point on a sample substrate with multiple wavelengths | Martin M. Liphardt, Blaine D. Johs, Craig M. Herzinger, Ping He, Christopher A. Goeden +1 more | 2009-04-21 |
| 7508510 | System for and method of investigating the exact same point on a sample substrate with multiple wavelengths | Galen L. Pfeiffer, Martin M. Liphardt, Blaine D. Johs, Craig M. Herzinger, Christopher A. Goeden +2 more | 2009-03-24 |
| 7505134 | Automated ellipsometer and the like systems | Blaine D. Johs, Ping He, Martin M. Liphardt, Christopher A. Goeden, James D. Welch | 2009-03-17 |
| 7477388 | Sample masking in ellipsometer and the like systems including detection of substrate backside reflections | Martin M. Liphardt, James D. Welch, Corey L. Bungay | 2009-01-13 |
| 7385697 | Sample analysis methodology utilizing electromagnetic radiation | Corey L. Bungay, Thomas E. Tiwald, Martin M. Liphardt, Ronald A. Synowicki, Gregory K. Pribil +3 more | 2008-06-10 |
| 7385698 | System and method of selectively monitoring sample front and backside reflections in ellipsometer and the like systems | James D. Welch, Martin M. Liphardt | 2008-06-10 |