Issued Patents All Time
Showing 1–9 of 9 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11675208 | Reflectometer, spectrophotometer, ellipsometer and polarimeter system with a super continuum laser source of a beam of electromagnetism, and improved detector system | Stefan Schoeche, Martin M. Liphardt, Ping He, Craig M. Herzinger, Jeffrey S. Hale +4 more | 2023-06-13 |
| 11391666 | Snapshot ellipsometer | Griffin A. P. Hovorka, Martin M. Liphardt | 2022-07-19 |
| 11035729 | Reflectometer, spectrophotometer, ellipsometer and polarimeter system with a super continuum laser source of a beam of electromagnetism, and improved detector system | Martin M. Liphardt | 2021-06-15 |
| 10634607 | Snapshot ellipsometer | Griffin A. P. Hovorka | 2020-04-28 |
| 10422739 | Reflectometer, spectrophotometer, ellipsometer and polarimeter systems with a super continuum laser source of a beam of electromagnetism, and improved detector system | Martin M. Liphardt | 2019-09-24 |
| 10175160 | Method to analyze spectroscopic ellipsometry or intensity data of porous samples utilizing the anisotropic bruggeman-effective medium theory | Stefan Schoeche, Jeffrey S. Hale, Craig M. Herzinger | 2019-01-08 |
| 10132684 | Reflectometer, spectrophometer, ellipsometer and polarimeter system with a super continuum laser-source of a beam of electromagnetism and improved detector system | Martin M. Liphardt | 2018-11-20 |
| 9976902 | Method to analyze spectroscopic ellipsometry data of porous samples utilizing the anisotropic Bruggeman-effective medium theory | Stefan Schoeche, Jeffrey S. Hale, Craig M. Herzinger | 2018-05-22 |
| 9599569 | Method to enhance sensitivity to surface normal optical functions of anisotropic films using attenuated total reflection | Thomas E. Tiwald | 2017-03-21 |