Issued Patents All Time
Showing 1–21 of 21 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10073120 | Integrated vacuum-ultraviolet, mid and near-ultraviolet, visible, near, mid and far infrared and terahertz optical hall effect (OHE) instrument, and method of use | Tino Hofmann, Mathias M. Schubert, Stefan Schoeche, Philipp Kuehne, Craig M. Herzinger +3 more | 2018-09-11 |
| 9851294 | Integrated mid-infrared, far infrared and terahertz optical Hall effect (OHE) instrument, and method of use | Tino Hofmann, Mathias M. Schubert, Stefan Schoeche, Sean R. Knight, Craig M. Herzinger +2 more | 2017-12-26 |
| 9599569 | Method to enhance sensitivity to surface normal optical functions of anisotropic films using attenuated total reflection | Jeremy A. Van Derslice | 2017-03-21 |
| 8531665 | Small volume cell | Galen L. Pfeiffer | 2013-09-10 |
| 8493565 | Small volume cell | Galen L. Pfeiffer, Martin M. Liphardt | 2013-07-23 |
| 8159672 | Sample investigating system and method of use | Martin M. Liphardt, Blaine D. Johs, Jeffrey S. Hale, Craig M. Herzinger, Steven E. Green +3 more | 2012-04-17 |
| 8130375 | Small volume cell | Galen L. Pfeiffer, Martin M. Liphardt | 2012-03-06 |
| 7817266 | Small volume cell | Galen L. Pfeiffer | 2010-10-19 |
| 7777883 | Ellipsometric investigation of anisotropic samples | Ronald A. Synowicki | 2010-08-17 |
| 7636161 | Back surface reflection reduction systems and methodology | — | 2009-12-22 |
| 7623237 | Sample investigating system | Martin M. Liphardt, Blaine D. Johs, Jeffrey S. Hale, Craig M. Herzinger, Steven E. Green +3 more | 2009-11-24 |
| 7385697 | Sample analysis methodology utilizing electromagnetic radiation | John A. Woollam, Corey L. Bungay, Martin M. Liphardt, Ronald A. Synowicki, Gregory K. Pribil +3 more | 2008-06-10 |
| 7349092 | System for reducing stress induced effects during determination of fluid optical constants | John A. Woollam, Galen L. Pfeiffer, Blaine D. Johs, Craig M. Herzinger | 2008-03-25 |
| 7283234 | Use of ellipsometry and surface plasmon resonance in monitoring thin film deposition or removal from a substrate surface | John A. Woollam, Blaine D. Johs, Martin M. Liphardt, James D. Welch | 2007-10-16 |
| 7265839 | Horizontal attenuated total reflection system | — | 2007-09-04 |
| 7193709 | Ellipsometric investigation of thin films | Blaine D. Johs | 2007-03-20 |
| 7187443 | Method of determining bulk refractive indicies of liquids from thin films thereof | Ronald A. Synowicki | 2007-03-06 |
| 7110912 | Method of applying parametric oscillators to model dielectric functions | — | 2006-09-19 |
| 6801312 | Method for evaluating complex refractive indicies utilizing IR range ellipsometry | — | 2004-10-05 |
| 6738139 | Method of determining bulk refractive indicies of fluids from thin films thereof | Ronald A. Synowicki | 2004-05-18 |
| 6455853 | Determination of thickness and impurity profiles in thin membranes utilizing spectorscopic data obtained from ellipsometric investigation of both front and back surfaces | Craig M. Herzinger | 2002-09-24 |