Issued Patents All Time
Showing 1–25 of 121 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12405210 | System for, and calibration and testing of directed beam ellipsometer systems | Ping He, Galen L. Pfeiffer | 2025-09-02 |
| 12332163 | System for, and calibration and testing of directed beam ellipsometer systems | Ping He, Galen L. Pfeiffer | 2025-06-17 |
| 11885738 | Reflectometer, spectrophotometer, ellipsometer or polarimeter system including sample imaging system that simultaneously meet the scheimpflug condition and overcomes keystone error | Galen L. Pfeiffer, Ping He | 2024-01-30 |
| 11821833 | Fast and accurate Mueller matrix infrared ellipsometer | Stefan Schoeche, Craig M. Herzinger, Steven E. Green, James D. Welch | 2023-11-21 |
| 11740176 | Fast and accurate mueller matrix infrared spectroscopic ellipsometer | Stefan Schoeche, Craig M. Herzinger, Steven E. Green, James D. Welch | 2023-08-29 |
| 11675208 | Reflectometer, spectrophotometer, ellipsometer and polarimeter system with a super continuum laser source of a beam of electromagnetism, and improved detector system | Stefan Schoeche, Ping He, Jeremy A. Van Derslice, Craig M. Herzinger, Jeffrey S. Hale +4 more | 2023-06-13 |
| 11391666 | Snapshot ellipsometer | Griffin A. P. Hovorka, Jeremy A. Van Derslice | 2022-07-19 |
| 11035729 | Reflectometer, spectrophotometer, ellipsometer and polarimeter system with a super continuum laser source of a beam of electromagnetism, and improved detector system | Jeremy A. Van Derslice | 2021-06-15 |
| 10989601 | Beam focusing and reflective optics | Jeffrey S. Hale, Ping He, Galen L. Pfeiffer, Craig M. Herzinger | 2021-04-27 |
| 10627288 | Systems and methods for producing a more uniform intensity wavelength dispersed beam of electromagnetic radiation entering a multielement detector, while maintaining information content therein | Ping He | 2020-04-21 |
| 10612976 | Systems and methods for producing a more uniform intensity wavelength dispersed beam of electromagnetic radiation entering a multi-element detector, while maintaining information content therein | Ping He | 2020-04-07 |
| 10444140 | Theta-theta sample positioning stage with application to sample mapping using reflectometer, spectrophotometer or ellipsometer system | Griffin A. P. Hovorka, Galen L. Pfeiffer | 2019-10-15 |
| 10422739 | Reflectometer, spectrophotometer, ellipsometer and polarimeter systems with a super continuum laser source of a beam of electromagnetism, and improved detector system | Jeremy A. Van Derslice | 2019-09-24 |
| 10338362 | Beam focusing and reflecting optics with enhanced detector system | Jeffrey S. Hale, Ping He, Galen L. Pfeiffer, Duane E. Meyer | 2019-07-02 |
| 10247611 | Enhanced detector operation made possible by application of a functional plurality of gratings and combination dichroic beam splitter-prisms | Ping He, Duane E. Meyer | 2019-04-02 |
| 10209528 | Operation of an electromagnetic radiation focusing element | — | 2019-02-19 |
| 10132684 | Reflectometer, spectrophometer, ellipsometer and polarimeter system with a super continuum laser-source of a beam of electromagnetism and improved detector system | Jeremy A. Van Derslice | 2018-11-20 |
| 10066989 | Information maintenance, intensity attenuation, and angle/plane of incidence control in electromagentic beams | Ping He | 2018-09-04 |
| 10018815 | Beam focusing and reflective optics | Jeffrey S. Hale, Ping He, Galen L. Pfeiffer | 2018-07-10 |
| 9952141 | Method of characterizing a beam of electromagnetic radiation in ellipsometer and the like systems | Jeffrey S. Hale, Craig M. Herzinger | 2018-04-24 |
| 9933357 | Elliposometer system with polarization state generator and polarization state analyzer in environmental chamber | Ping He, Gregory K. Pribil | 2018-04-03 |
| 9921395 | Beam focusing and beam collecting optics with wavelength dependent filter element adjustment of beam area | Jeffrey S. Hale, Ping He, Galen L. Pfeiffer | 2018-03-20 |
| 9658151 | System for viewing samples that are undergoing ellipsometric investigation in real time | Galen L. Pfeiffer | 2017-05-23 |
| 9546943 | System and method for investigating change in optical properties of a porous effective substrate surface as a function of a sequence of solvent partial pressures at atmospheric pressure | Jeremy A. Vanderslice, Christopher A. Goeden | 2017-01-17 |
| 9500843 | Beam focusing and beam collecting optics | Jeffrey S. Hale, Ping He, Galen L. Pfeiffer | 2016-11-22 |