Issued Patents All Time
Showing 51–75 of 121 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8248606 | Sample mapping in environmental chamber | Blaine D. Johs | 2012-08-21 |
| 8223334 | Method of improving ellipsometric and the like data | Blaine D. Johs | 2012-07-17 |
| 8189193 | System and method of applying horizontally oriented arc-lamps in ellipsometer or the like systems | Ping He, James D. Welch | 2012-05-29 |
| 8169611 | Terahertz-infrared ellipsometer system, and method of use | Craig M. Herzinger, Matias M. Schubert, Tino Hofmann, John A. Woollam | 2012-05-01 |
| 8159672 | Sample investigating system and method of use | Thomas E. Tiwald, Blaine D. Johs, Jeffrey S. Hale, Craig M. Herzinger, Steven E. Green +3 more | 2012-04-17 |
| 8130375 | Small volume cell | Galen L. Pfeiffer, Thomas E. Tiwald | 2012-03-06 |
| 8059276 | Ellipsometric investigation and analysis of textured samples | James N. Hilfiker, Jianing Sun, Ping He | 2011-11-15 |
| 8013996 | Spatial filter in sample investigation system | Ping He, Blaine D. Johs, Craig M. Herzinger | 2011-09-06 |
| 7965390 | Automatic sample alignment system and method of use | — | 2011-06-21 |
| 7907280 | Method of constructing a deviation angle self compensating substantially achromatic retarder to compensate beam traslation | Blaine D. Johs, Steven E. Green, Craig M. Herzinger, Duane E. Meyer | 2011-03-15 |
| 7872751 | Fast sample height, AOI and POI alignment in mapping ellipsometer or the like | Jeffrey S. Hale, Ping He, Galen L. Pfeiffer | 2011-01-18 |
| 7830512 | System and method for controlling intensity of a beam of electromagnetic radiation in ellipsometers and polarimeters | Galen L. Pfeiffer | 2010-11-09 |
| 7821637 | System for controlling intensity of a beam of electromagnetic radiation and method for investigating materials with low specular reflectance and/or are depolarizing | Galen L. Pfeiffer, James N. Hilfiker | 2010-10-26 |
| 7777878 | Application of digital light processor in scanning spectrometer and imaging ellipsometer and the like systems | — | 2010-08-17 |
| 7768660 | Non-destructive approach to ellipsometric monitoring of a film coating on the inner surface of a tube shaped sample | Gregory K. Pribil, John A. Woollam, James D. Welch | 2010-08-03 |
| 7746472 | Automated ellipsometer and the like systems | Blaine D. Johs, Ping He, Christopher A. Goeden, John A. Woollam, James D. Welch | 2010-06-29 |
| 7746471 | Flying mobile on-board ellipsometer, polarimeter, reflectometer and the like systems | Blaine D. Johs, Ping He, Christopher A. Goeden, John A. Woollam, James D. Welch | 2010-06-29 |
| 7738105 | System and method of applying horizontally oriented arc-lamps in ellipsometer or the like systems | Ping He, James D. Welch | 2010-06-15 |
| 7671989 | Information maintenance during intensity attenuation in focused beams | Ping He | 2010-03-02 |
| 7633625 | Spectroscopic ellipsometer and polarimeter systems | John A. Woollam, Blaine D. Johs, Craig M. Herzinger, Ping He, Galen L. Pfeiffer | 2009-12-15 |
| 7623238 | System for and method of reducing change caused by motor vibrations in ellipsometers, polarimeters or the like | Ping He | 2009-11-24 |
| 7623237 | Sample investigating system | Thomas E. Tiwald, Blaine D. Johs, Jeffrey S. Hale, Craig M. Herzinger, Steven E. Green +3 more | 2009-11-24 |
| 7619752 | Sample orientation system and method | Christopher A. Goeden | 2009-11-17 |
| 7616319 | Spectroscopic ellipsometer and polarimeter systems | John A. Woollam, Blaine D. Johs, Craig M. Herzinger, Ping He, Galen L. Pfeiffer | 2009-11-10 |
| 7567345 | Ellipsometer meeting scheimpflug condition with provision of an essentially circular electromagnetic radiation spot on a sample | Brooks A. Hitt, Jeffrey S. Hale, Ping He | 2009-07-28 |