Issued Patents All Time
Showing 1–16 of 16 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9546943 | System and method for investigating change in optical properties of a porous effective substrate surface as a function of a sequence of solvent partial pressures at atmospheric pressure | Jeremy A. Vanderslice, Martin M. Liphardt | 2017-01-17 |
| 7796260 | System and method of controlling intensity of an electromagnetic beam | Blaine D. Johs, Galen L. Pfeiffer | 2010-09-14 |
| 7746471 | Flying mobile on-board ellipsometer, polarimeter, reflectometer and the like systems | Blaine D. Johs, Ping He, Martin M. Liphardt, John A. Woollam, James D. Welch | 2010-06-29 |
| 7746472 | Automated ellipsometer and the like systems | Blaine D. Johs, Ping He, Martin M. Liphardt, John A. Woollam, James D. Welch | 2010-06-29 |
| 7619752 | Sample orientation system and method | Martin M. Liphardt | 2009-11-17 |
| 7535566 | Beam chromatic shifting and directing means | Blaine D. Johs, Galen L. Pfeiffer, Jeffrey S. Hale, Brian D. Guenther, Martin M. Liphardt +1 more | 2009-05-19 |
| 7522279 | System for and method of investigating the exact same point on a sample substrate with multiple wavelengths | Martin M. Liphardt, Blaine D. Johs, Craig M. Herzinger, Ping He, John A. Woollam +1 more | 2009-04-21 |
| 7508510 | System for and method of investigating the exact same point on a sample substrate with multiple wavelengths | Galen L. Pfeiffer, Martin M. Liphardt, Blaine D. Johs, Craig M. Herzinger, Ping He +2 more | 2009-03-24 |
| 7505134 | Automated ellipsometer and the like systems | Blaine D. Johs, Ping He, Martin M. Liphardt, John A. Woollam, James D. Welch | 2009-03-17 |
| 7301631 | Control of uncertain angle of incidence of beam from Arc lamp | Blaine D. Johs, Ping He, Galen L. Pfeiffer, Steven E. Green, Martin M. Liphardt | 2007-11-27 |
| 7277171 | Flying mobile on-board ellipsometer, polarimeter, reflectometer and the like systems | Blaine D. Johs, Ping He, Martin M. Liphardt, John A. Woollam, James D. Welch | 2007-10-02 |
| 7265838 | Method of calibrating effects of multi-AOI-system for easy changing angles-of-incidence in ellipsometers and the like | Blaine D. Johs, Ping He, Martin M. Liphardt, John A. Woollam, James D. Welch | 2007-09-04 |
| 7136172 | System and method for setting and compensating errors in AOI and POI of a beam of EM radiation | Blaine D. Johs, Galen L. Pfeiffer, Martin M. Liphardt | 2006-11-14 |
| 7099006 | Ellipsometer or polarimeter and the like system with beam chromatic shifting and directing means | Blaine D. Johs, Galen L. Pfeiffer, Jeffrey S. Hale | 2006-08-29 |
| 7057717 | System for and method of investigating the exact same point on a sample substrate with at least two wavelengths | Martin M. Liphardt, Blaine D. Johs, Craig M. Herzinger, Ping He, John A. Woollam +1 more | 2006-06-06 |
| 6859278 | Multi-AOI-system for easy changing angles-of-incidence in ellipsometer, polarimeter and reflectometer systems | Blaine D. Johs, Ping He, Martin M. Liphardt, John A. Woollam, James D. Welch | 2005-02-22 |