Issued Patents All Time
Showing 1–25 of 88 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11821833 | Fast and accurate Mueller matrix infrared ellipsometer | Stefan Schoeche, Steven E. Green, Martin M. Liphardt, James D. Welch | 2023-11-21 |
| 11740176 | Fast and accurate mueller matrix infrared spectroscopic ellipsometer | Stefan Schoeche, Steven E. Green, Martin M. Liphardt, James D. Welch | 2023-08-29 |
| 11675208 | Reflectometer, spectrophotometer, ellipsometer and polarimeter system with a super continuum laser source of a beam of electromagnetism, and improved detector system | Stefan Schoeche, Martin M. Liphardt, Ping He, Jeremy A. Van Derslice, Jeffrey S. Hale +4 more | 2023-06-13 |
| 10989601 | Beam focusing and reflective optics | Martin M. Liphardt, Jeffrey S. Hale, Ping He, Galen L. Pfeiffer | 2021-04-27 |
| 10914866 | Methods and materials for metamaterials exhibiting form-induced birefringence | Tino Hofmann, Daniel Fullager, Stefan Schoeche, Susanne Madeline Lee, Erin K. Sharma | 2021-02-09 |
| 10775298 | Ellipsometer or polarimeter system having at least one rotating element which is driven by a motor comprising air bearing | Christopher D. Hassler, Galen L. Pfeiffer, Jeffrey S. Hale, Brian D. Guenther, Brooks A. Hitt | 2020-09-15 |
| 10606093 | Biased fast axis retarder system | — | 2020-03-31 |
| 10175160 | Method to analyze spectroscopic ellipsometry or intensity data of porous samples utilizing the anisotropic bruggeman-effective medium theory | Stefan Schoeche, Jeremy A. Van Derslice, Jeffrey S. Hale | 2019-01-08 |
| 10101265 | Birefringence imaging chromatography based on highly ordered 3D nanostructures | Mathias M. Schubert, Tino Hofmann, David S. Hage, Erika Pfaunmiller, John A. Woollam +1 more | 2018-10-16 |
| 10073120 | Integrated vacuum-ultraviolet, mid and near-ultraviolet, visible, near, mid and far infrared and terahertz optical hall effect (OHE) instrument, and method of use | Tino Hofmann, Mathias M. Schubert, Stefan Schoeche, Philipp Kuehne, John A. Woollam +3 more | 2018-09-11 |
| 10061068 | Deviation angle self-compensating substantially achromatic retarder | Ping He, Jeffrey S. Hale | 2018-08-28 |
| 10026167 | Method of obtaining micrographs of transparent or semi-transparent specimens using anisotropic contrast | Tino Hofmann, Mathias M. Schubert, Tadas Kasputis, Angela K. Pannier, John A. Woollam | 2018-07-17 |
| 9976902 | Method to analyze spectroscopic ellipsometry data of porous samples utilizing the anisotropic Bruggeman-effective medium theory | Stefan Schoeche, Jeremy A. Van Derslice, Jeffrey S. Hale | 2018-05-22 |
| 9952141 | Method of characterizing a beam of electromagnetic radiation in ellipsometer and the like systems | Jeffrey S. Hale, Martin M. Liphardt | 2018-04-24 |
| 9921352 | Biased fast axis retarder system | — | 2018-03-20 |
| 9851294 | Integrated mid-infrared, far infrared and terahertz optical Hall effect (OHE) instrument, and method of use | Tino Hofmann, Mathias M. Schubert, Stefan Schoeche, Sean R. Knight, John A. Woollam +2 more | 2017-12-26 |
| 9121757 | Terahertz ellipsometer system, and method of use | — | 2015-09-01 |
| 9041927 | Terahertz-infrared ellipsometer system, and method of use | Mathias M. Schubert, Tino Hofmann, Martin M. Liphardt, John A. Woollam | 2015-05-26 |
| 8934096 | Terahertz-infrared ellipsometer system, and method of use | Mathias M. Schubert, Tino Hofmann, Martin M. Liphardt, John A. Woollam | 2015-01-13 |
| 8736838 | Terahertz ellipsometer system, and method of use | — | 2014-05-27 |
| 8705032 | Terahertz-infrared ellipsometer system, and method of use | Mathias M. Schubert, Tino Hofmann, Martin M. Liphardt, John A. Woollam | 2014-04-22 |
| 8564777 | System and method for compensating detector non-idealities | — | 2013-10-22 |
| 8488119 | Terahertz-infrared ellipsometer system, and method of use | Mathias M. Schubert, Tino Hofmann, Martin M. Liphardt, John A. Woollam | 2013-07-16 |
| 8462341 | Mounting for deviation angle self compensating substantially achromatic retarder | Ping He, Blaine D. Johs, Steven E. Green, Duane E. Meyer, Martin M. Liphardt | 2013-06-11 |
| 8416408 | Terahertz-infrared ellipsometer system, and method of use | Mathias M. Schubert, Tino Hofmann, Martin M. Liphardt, John A. Woollam | 2013-04-09 |