CH

Craig M. Herzinger

JC J.A. Woollam Co.: 87 patents #3 of 52Top 6%
UN University Of Nebraska: 5 patents #59 of 808Top 8%
UR University Of Nebraska Board Of Regents: 4 patents #1 of 21Top 5%
UC University Of North Carolina Charlotte: 1 patents #1 of 19Top 6%
📍 Lincoln, NE: #6 of 1,303 inventorsTop 1%
🗺 Nebraska: #17 of 5,697 inventorsTop 1%
Overall (All Time): #18,820 of 4,157,543Top 1%
88
Patents All Time

Issued Patents All Time

Showing 51–75 of 88 patents

Patent #TitleCo-InventorsDate
7215424 Broadband ellipsometer or polarimeter system including at least one multiple element lens Martin M. Liphardt, Blaine D. Johs, Jeffrey S. Hale, Steven E. Green, Ping He +1 more 2007-05-08
7193708 Time efficient method for investigating sample systems with spectroscopic electromagnetic radiation 2007-03-20
7193710 Rotating or rotatable compensator spectroscopic ellipsometer system including multiple element lenses Blaine D. Johs, Martin M. Liphardt, Jeffrey S. Hale, Steven E. Green, Ping He +1 more 2007-03-20
7158231 Spectroscopic ellipsometer and polarimeter systems John A. Woollam, Blaine D. Johs, Ping He, Martin M. Liphardt, Galen L. Pfeiffer 2007-01-02
7151605 Methodology for providing good data at all wavelengths over a spectroscopic range Steven E. Green, Ronald A. Synowicki, James D. Welch 2006-12-19
7136162 Alignment of ellipsometer beam to sample surface Martin M. Liphardt, Brian D. Guenther, Steven E. Green, Galen L. Pfeiffer, Ping He 2006-11-14
7075649 Discrete polarization state rotatable compensator spectroscopic ellipsometer system, and method of calibration Blaine D. Johs, Steven E. Green, Jeffrey S. Hale 2006-07-11
7057717 System for and method of investigating the exact same point on a sample substrate with at least two wavelengths Martin M. Liphardt, Blaine D. Johs, Ping He, Christopher A. Goeden, John A. Woollam +1 more 2006-06-06
6982792 Spectrophotometer, ellipsometer, polarimeter and the like systems John A. Woollam, Steven E. Green, Ping He, Blaine D. Johs, Galen L. Pfeiffer +2 more 2006-01-03
6950182 Functional equivalent to spatial filter in ellipsometer and the like systems Martin M. Liphardt, Blaine D. Johs, Ping He 2005-09-27
6940595 Application of spectroscopic ellipsometry to in-situ real time fabrication of multiple layer alternating high/low refractive index filters Blaine D. Johs, Jeffrey S. Hale, John A. Woollam 2005-09-06
6937341 System and method enabling simultaneous investigation of sample with two beams of electromagnetic radiation John A. Woollam, Galen L. Pfeiffer, Daniel W. Thompson, Blaine D. Johs 2005-08-30
6930813 Spatial filter source beam conditioning in ellipsometer and the like systems Martin M. Liphardt, Blaine D. Johs, Ping He, James D. Welch 2005-08-16
6831740 Methodology for improving precision of data acquired by spectrophotometer systems Steven E. Green, Ronald A. Synowicki 2004-12-14
6822738 Spectroscopic rotating compensator ellipsometer system with pseudo-achromatic retarder system Blaine D. Johs 2004-11-23
6804004 Multiple-element lens systems and methods for uncorrelated evaluation of parameters in parameterized mathematical model equations for lens retardance, in ellipometry and polarimetry Blaine D. Johs, Ping He, Martin M. Liphardt 2004-10-12
6795184 Odd bounce image rotation system in ellipsometer systems Steven E. Green, Blaine D. Johs 2004-09-21
6549282 Methods for uncorrelated evaluation of parameters in parameterized mathematical model equations for lens retardance, in ellipsometry and polarimetry systems Blaine D. Johs, Ping He, Martin M. Ciphardt 2003-04-15
6483586 Beam splitting analyzer means in rotating compensator ellipsometer Blaine D. Johs, Steven E. Green, Jeffrey S. Hale 2002-11-19
6455853 Determination of thickness and impurity profiles in thin membranes utilizing spectorscopic data obtained from ellipsometric investigation of both front and back surfaces Thomas E. Tiwald 2002-09-24
6456376 Rotating compensator ellipsometer system with spatial filter Martin M. Liphardt, Blaine D. Johs, Ping He 2002-09-24
6441902 Method for evaluating sample system anisotropic refractive indices and orientations thereof in multiple dimensions James N. Hilfiker, Corey L. Bungay 2002-08-27
6353477 Regression calibrated spectroscopic rotating compensator ellipsometer system with pseudo-achromatic retarder system Blaine D. Johs 2002-03-05
6141102 Single trianglular shaped optical retarder element for use in spectroscopic ellipsometer and polarimeter systems Blaine D. Johs, Steven E. Green 2000-10-31
6137618 Compact, high extinction coefficient combination brewster angle and other than brewster angle polarizing system, and method of use 2000-10-24